Konferenzbeitrag (1394)

7481.
Konferenzbeitrag
Pundt, A.; Laudahn, U.; von H├╝lsen, U.; Geyer, U.; Wagner, T.; Getzlaff, M.; Bode, M.; Wiesendanger, R.; Kirchheim, R.: Hydrogen induced plastic deformation of thin films. In: Thin Films: Stresses and Mechanical Properties III, S. 75 - 86 (Hg. Vinci, R. P.; O. Kraft, N.; Moody, N.; Besser, P.; Shaffer, E.). Thin Films: Stresses and Mechanical Properties III. Symposium V at the 1999 MRS Fall Meeting, Boston, Mass., 29. November 1999 - 03. Dezember 1999. Materials Research Society, Warrendale/PA (2000)
7482.
Konferenzbeitrag
Ritley, K. A.; Schreiber, F.; Just, K.-P.; Dosch, H.; Niesen, T. P.; Aldinger, F.: Annealing studies of solution-deposited ZrO2 thin films on self-assembled monolayers. In: 4th International Conference on Thin Films Physics and Applications, S. 414 - 417 (Hg. Chu, J.; Liu, P.; Chang, Y.). 4th International Conference on Thin Films Physics and Applications, Shanghai [China], 05. Mai 2000 - 11. Mai 2000. (2000)
7483.
Konferenzbeitrag
Ritley, K. A.; Schreiber, F.; Just, K.-P.; Dosch, H.; Niesen, T. P.; Aldinger, F.: Annealing studies of solution-deposited ZrO2 thin films on self-assembled monolayers. In: 4th International Conference on Thin Films Physics and Applications, S. 414 - 417 (Hg. Chu, J.; Liu, P.; Chang, Y.). 4th International Conference on Thin Films Physics and Applications, Shanghai [China], 05. Mai 2000 - 11. Mai 2000. (2000)
7484.
Konferenzbeitrag
R├╝hle, M.; Els├Ąsser, C.; Scheu, C.; Sigle, W.: Advanced instrumentations for interface studies by electron energy-loss spectroscopy (EELS, ELNES and ESI)? In: Microscopy and Microanalysis 2000, S. 188 - 189 (Hg. Bailey, G.W.). Microscopy and Microanalysis 2000, Philadelphia, Pa., 13. August 2000 - 17. August 2000. Springer, New York (2000)
7485.
Konferenzbeitrag
R├╝hle, M.; Els├Ąsser, C.; Scheu, C.; Sigle, W.: The role of microanalysis in the characterization of interfaces. In: Microbeam Analysis 2000: Proceedings of the Second Conference of the International Union of Microbeam Analysis Societies, S. 1 - 2 (Hg. Williams, D. B.; Shimizu, R.). Microbeam Analysis 2000. Second Conference of the International Union of Microbeam Analysis Societies, Kailua-Kona, Hawai, 09. Juli 2000 - 14. Juli 2007. Institute of Physics Publ., Bristol (2000)
7486.
Konferenzbeitrag
Russew, K.; Sommer, F.: Relaxation phenomena in the Al7.5Cu17.5Ni10Zr65 bulk metallic glass studied by bend stress and anelastic strain relaxation under isothermal and non-isothermal conditions. In: Materials Development and Processing - Bulk Amorphous Materials, Undercooling and Powder Metallurgy, Euromat 99, Vol. 8, S. 57 - 64 (Hg. Wood, J. W.; Schultz, L.; Herlach, D. M.). Euromat 99. European Congress on Advanced Materials and Processes, M├╝nchen, 27. September 1999 - 30. September 1999. Wiley-VCH, Weinheim (2000)
7487.
Konferenzbeitrag
Russew, K.; Stojanowa, L.; Sommer, F.: Viscosity and thermal expansion of the Al7.5Cu17.5Ni10Zr65 bulk metallic glass materials development and processing-bulk amorphous materials undercooling and powder metallurgy. In: Materials Development and Processing - Bulk Amorphous Materials, Undercooling and Powder Metallurgy, Euromat 99, Vol. 8, S. 65 - 70 (Hg. Wood, J. W.; Schultz, L.; Herlach, D. M.). Euromat 99. European Congress on Advanced Materials and Processes, M├╝nchen, 27. September 1999 - 30. September 1999. Wiley-VCH, Weinheim (2000)
7488.
Konferenzbeitrag
Scheu, C.; Stein, W.; Schweinfest, R.; Wagner, T.; R├╝hle, M.: A combined approach of analytical and high-resolution TEM to determine the interface structure of Cu/(1120) ╬▒-Al2O3. In: Proceedings of the 12th European Congress on Electron Microscopy, Vol. 2: Physical Sciences, S. 413 - 414 (Hg. Gemperlova, J.; Vavra, I.). 12th European Congress on Electron Microscopy, Brno/Czech Republic, 09. Juli 2000 - 14. Juli 2000. Czechoslovak Society for Electron Microscopy (2000)
7489.
Konferenzbeitrag
Scheu, C.; Stein, W.; Schweinfest, R.; Wagner, T.; R├╝hle, M.: Atomic structure and bonding of epitaxial Cu films on (110) a-Al2O3. In: Proceedings Microscopy and Microanalysis 2000, S. 182 - 183 (Hg. Bailey, G.W.). Microscopy and Microanalysis 2000, Philadelphia, Pa., 17. August 2000 - 20. August 2000. Springer, New York (2000)
7490.
Konferenzbeitrag
Schwaiger, R.; Kraft, O.: Fatigue behaviour of thin silver films investigated by dynamic microbeam deflection. In: Thin Films: Stresses and Mechanical Properties VIII, S. 201 - 206 (Hg. Vinci, R.; Kraft, O.; Moody, N.; Besser, P.; Shaffer II, E.). Thin Films: Stresses and Mechanical Properties VIII. Symposium V at the 1999 MRS Fall Meeting, Boston, Mass., 29. November 1999 - 03. Dezember 1999. Materials Research Society, Warrendale/PA (2000)
7491.
Konferenzbeitrag
Seeger, A.: Scattering by the two-dimensional potential sin¤ć/r. In: Day on Diffraction. Proceedings of the International Seminar "Day of Diffraction 2000", S. 134 - 142 (Hg. Andronov, I. V.). Day on Diffraction. Millennium Workshop, St. Petersburg, Russia, 29. Mai 2000 - 01. Juni 2000. (2000)
7492.
Konferenzbeitrag
Seifert, H. J.: Thermodynamics of ceramic materials. In: High Temperature Materials Chemistry (HTMC-X). Proceedings IUPAC Conference, S. 37 - 42 (Hg. Hilpert, K.; Froben, F. W.; Singheiser, L.). High Temperature Materials Chemistry (HTMC-X), J├╝lich, Germany, 04. Oktober 2000 - 14. Oktober 2000. Forschungszentrum J├╝lich GmbH, J├╝lich (2000)
7493.
Konferenzbeitrag
Slavyanov, S.; Ern, C.; Dosch, H.: Rigorous mathematical models for the reconstruction of thin films profiles from X-ray intensities. In: Proceedings of Days of Diffraction, S. 161 - 167 (Hg. Andronov, I. V.). SPbU, St. Petersburg/Russia (2000)
7494.
Konferenzbeitrag
Sommadossi, S.; Khanna, P. K.; Bhatnagar, S. K.; Litynska, L.; Zieba, P.; Gust, W.; Mittemeijer, E. J.: Development of Cu/Cu interconnections using an indium interlayer. In: Euromat 99. 6th European Congress on Advanced Materials and Processes. Vol. 4, S. 214 - 218 (Hg. Jouffray, B.; Svejcar, J.). EUROMAT 99, 6th European Congress on Advanced Materials and Processes, M├╝nchen, 27. September 1999 - 30. September 1999. Wiley-VCH, Weinheim (2000)
7495.
Konferenzbeitrag
Sturm, S.; Recnik, A.; Scheu, C.; Ceh, M.: EDS study of planar faults in SrO doped SrTiO3. In: Proceedings of the 12th European Congress on Electron Microscopy. Vol. 2: Physical Sciences, S. 221 - 222 (Hg. Gemperlova, J.; Vavra, I.). Proceedings of the 12th European Congress on Electron Microscopy, Brno/Czech Republic, 09. Juli 2000 - 14. Juli 2000. Czechoslovak Society for Electron Microscopy (2000)
7496.
Konferenzbeitrag
Tas, A. C.; Schluckwerder, H.; Majewski, P. J.; Aldinger, F.: Chemical synthesis of pure and doped LaGaO3 powders of oxide fuel cells by amorphous citrate/EG method. In: Chemical Processing of Dielectrics, Insulators and Electronic Ceramics, S. 237 - 243 (Hg. Jones, A. J.). Chemical Processing of Dielectrics, Insulators and Electronic Ceramics. Symposium NN held at the 1999 MRS Fall Meeting, Boston, Mass., 29. November 1999 - 01. Dezember 1999. Materials Research Society, Warrendale/PA (2000)
7497.
Konferenzbeitrag
van Benthem, K.; Scheu, C.; Sigle, W.; R├╝hle, M.: Electronic structure investigations of metal/strontiumtitanate interfaces. In: Proceedings of the 12th European Congress on Electron Microscopy. Vol. 2: Physical Sciences, S. 421 - 422 (Hg. Gemperlova, J.; Vavra, I.). 12th European Congress on Electron Microscopy (EUREM2000), Brno [Czech Republic], 09. Juli 2000 - 14. Juli 2000. Czechoslovak Society for Electron Microscopy, Brno (2000)
7498.
Konferenzbeitrag
Wagner, T.; M├╝ller, D.: Microstructural evolution of ion-bombarded copper thin films. In: Fundamental Mechanisms of Low-Energy-Beam-Modified Surface Growth and Processing, S. 85 - 90 (Hg. Moss, S.). Fundamental Mechanisms of Low-Energy-Beam-Modified Surface Growth and Processing. Symposium, Boston, Mass, 29. November 1999 - 01. Dezember 1999. Materials Research Society, Warrendale/PA (2000)
7499.
Konferenzbeitrag
Zhang, Y. W.; Hadjipanayis, G. C.; Goll, D.; Kronm├╝ller, H.; Chen, C.; Nelson, C.; Krishnan, K.: Evolution of microstructure and microchemistry in the high-temperature Sm(Co, Fe, Cu, Zr)z magnets. In: Proceedings of the 16th International Workshop on Rare-Earth Magnets and Their Applications, S. 169 - 178 (Hg. Kaneko, H.; Homma, M.; Okada, M.). 16th International Workshop on Rare-Earth Magnets and Their Applications, Sendai, Japan, 10. September 2000 - 13. September 2000. (2000)
7500.
Konferenzbeitrag
M├Âbus, R.; Kienzle, O.: Interface structure revieval by HREM: from entropy maximisation to R-Factor fits. In: Electron Microscopy and Analysis 1999, S. 263 - 266 (Hg. Kiely, C. J.). Electron Microscopy and Analysis 1999, Sheffield, 24. August 1999 - 27. August 1999. Institute of Physics Publ., Bristol (1999)
Zur Redakteursansicht