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Schabert, F.; Guckenberger, R.: Correction of specimen tilt and line flattening. In: Procedures in Scanning Probe Microscopies, pp. 32 - 33 (Eds. J.P., R.J. C.; Engel, A.; Frommer, J.; Gaub, H.E.; Gerwirth, A.A. et al.). John Wiley & Sons, Chichester-New York (1998)

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