Jin-Phillipp, N. Y.; Du, K.; Phillipp, F.: Quantitative high-resolution electron microscopy studies of strain distribution and defect formation in III-V semiconductor quantum dots. In: Fabrication and Characterization of Atomic Scale Structures. Proceedings of the 5th International Symposium on Advanced Physical Fields, pp. 33 - 39 (Ed. Yoshihara, K.). Fabrication and Characterization of Atomic Scale Structures. 5th International Symposium on Advanced Physical Fields (APF-5), Tsukuba, Japan, March 06, 2000 - March 09, 2000. National Research Institute for Metals, Tokyo (2000)

Jin-Phillipp, N. Y.; Phillipp, F.: Direct strain measurements in InP/GaInP quantum dots by HREM. In: Proceedings of the 12th European Congress on Electron Microscopy. Vol. 2: Physical Sciences, pp. 299 - 300 (Eds. Ciampor, P.; Frank, L.; Gemperlova, J.; Vavra, I.). 12th European Congress on Electron Microscopy (EUREM2000), Brno [Czech Republic], July 09, 2000 - July 14, 2000. Czechoslovak Society for Electron Microscopy, Brno (2000)

Khanna, P. K.; Sommadossi, S.; Lopez, G.; Bielanska, E.; Zieba, P.; Chang, L. S.; Gust, W.; Mittemeijer, E. J.: Novel Ni/Al/Ni diffusion soldered joints for high temperature applications. In: Euromat 99. 6th European Congress on Advanced Materials and Processes. Vol. 4, pp. 220 - 224 (Eds. Jouffray, B.; Svejcar, J.). EUROMAT 99, 6th European Congress on Advanced Materials and Processes, München, September 27, 1999 - September 30, 1999. Wiley-VCH, Weinheim (2000)

Kim, D.; Nix, W. D.; Arzt, E.; Deal, M. D.; Plummer, J. D.: Diffusional Hillock formation in Al thin films contolled by creep. In: Thin Films: Stresses and Mechanical Properties VIII, pp. 129 - 134 (Eds. Vinci, R.; Kraft, O.; Moody, N.; Besser, P.; Shaffer II, E.). Thin Films: Stresses and Mechanical Properties VIII. Symposium V at the 1999 MRS Fall Meeting, Boston, Mass., November 29, 1999 - December 03, 1999. MRS, Warrendale/PA (2000)

Kohnle, C.; Mintchev, S.; Schmauder, S.; Brunner, D.: Fracture of metal/ceramic interfaces. In: Proceedings of Werkstoffwoche 2000 - Materials Week 2000. Werkstoffwoche 2000 - Materials Week 2000, München, September 25, 2000 - September 28, 2000. Werkstoff-Informationsgesellschaft, Frankfurt/Main (2000)

Köstlmeier, S.; Elsässer, C.: Ab-initio study of the local bonding at metal/ceramic heterophase boundaries. In: Interfacial Engineering for Optimized Properties II, pp. 43 - 48 (Eds. Carter, B. C.; Hall, E. L.; Briant, C. L.; Nutt, S.). Interfacial Engineering for Optimized Properties II. Symposium at the MRS Fall Meeting, Boston, Mass., December 01, 1999 - December 02, 1999. (2000)

Kronmüller, H.: Magnetic techniques for the study of the microstructure of crystalline metals. In: Proceedings International Symposium on Relationship between Magnetic and Structural Properties - Basis and Applications, pp. 3 - 14 (Eds. Echigoya, J.; Takahashi, S.; Umakoshi, Y.; Watanabe, T.). International Symposium on Relationship between Magnetic and Structural Properties - Basis and Applications, Sendai, Japan, 2000. Iron and Steel Institute of Japan, Tokyo (2000)

Kronmüller, H.: Review of coercivity mechanisms and the microstructure of nanocrystalline permanent magnets. In: Proceedings of the 11th International Symposium on Magnetic Anisotropy and Coercivity in Rare-Earth Transition Metal Alloys, pp. 83 - 92 (Eds. Kaneko, H.; Homma, M.; Okada, M.). 11th International Symposium on Magnetic Anisotropy and Coercivity in Rare-Earth Transition Metal Alloys. The Japan Institute of Metal, Sendai (2000)

Lejcek, P.; Hofmann, S.; Paidar, V.: Structure/property relationship for grain boundary engineering of polycrystals. In: Proceedings of the 1st International Conference on Advanced Materials Processing, pp. 615 - 620 (Eds. Zhang, D. L.; Pickering, K. L.; Xiong, X. Y.). 1st International Conference on Advanced Materials Processing, Rotorua, NZ, November 19, 2000 - November 23, 2000. Institute of Materials Engineering Australasia, North Melbourne/Victoria (2000)

Leoni, M.; Welzel, U.; Lamparter, P.; Mittemeijer, E. J.: Residual stress analysis in fibre-textured thin films; transverse isotropy and grain interaction. In: Proceedings of the Sixth International Conference on Residual Stresses, Oxford, UK 2000, pp. 811 - 818 (Ed. Webster, G. A.). Sixth International Conference on Residual Stresses, Oxford, UK, July 10, 2000 - July 12, 2000. IOM Communications, London (2000)

Niesen, T. P.; Bill, J.; Aldinger, F.: Deposition of titania thin films on different functionalized organic self-assembled monolayers. In: EUROMAT 99, Vol. 12, pp. 289 - 294. EUROMAT 99, European Congress on Advanced Materials and Processes in conjunction with the Exhibition MATERIALICA, München, September 27, 1999 - September 30, 1999. Wiley-VCH, Weinheim (2000)

Niesen, T.; Fuchs, T.; Bill, J.; Aldinger, F.; Sampathkumaran, U.; de Guire, M.: Deposition of nanocrystalline zirconia thin films on organic self-assembled monolayers by a continous flow technique. In: Proceedings of Werkstoffwoche 2000 - Materials Week 2000. Werkstoffwoche 2000 - Materials Week 2000, Symposium L4 on Synthesis and Technolgical Applications of Nanocrystallites and Materials Assembled from Nanometer-Sized Clusters, Session - Synthesis and Processing, Werkstoffwoche-Partnerschaft GbR, München, September 25, 2000 - September 28, 2000. Werkstoff-Informationsgesellschaft, Frankfurt/Main (2000)

Nucci, J. A. R.; Keller, R.; Krämer, S.; Volkert, C. A.; Gross, M.: Localized measurement of strains in damascene copper interconnects by convergent-beam electron diffraction. In: Materials, Technology and Reliability for Advanced Interconnects and Low-k Dielectrics, pp. D 851 - D 856 (Eds. Maex, K.; Joo, Y.-C.; Oehrlein, G. S.; Ogawa, S.; Wetzel, J. T.). Materials, Technology and Reliability for Advanced Interconnects and Low-k Dielectrics, San Francisco, Calif., April 23, 2000 - April 27, 2000. MRS, Warrendale (2000)

Nufer, S.; Gemming, T.; Kurtz, W.; Rühle, M.: Analysis of segregation behaviour of grain boundaries in α-Al₂O₃ by analytical and high-resolution TEM. In: Proceedings of the 12th European Congress on Electron Microscopy, Vol. 2, pp. 107 - 108 (Eds. Frank, L.; Ciampor, F.). 12th European Congress on Electron Microscopy, Brno, Czech Republic, July 09, 2000 - July 14, 2000. Czechoslovak Society for Electron Microscopy, Brno/Czech Republic (2000)

Peng, J.; Seifert, H. J.; Aldinger, F.: Thermal stability of precursor-derived Si-(B-)C-N ceramics. In: Proceedings of the American Ceramic Society's 102nd Annual Meeting, pp. 251 - 262 (Eds. Bansal, N. P.; Singh, J. P.). American Ceramic Society's 102nd Annual Meeting, St. Louis, USA, April 30, 2000 - May 03, 2000. American Ceramic Society, Westerville/OH (2000)

Pundt, A.; Laudahn, U.; von Hülsen, U.; Geyer, U.; Wagner, T.; Getzlaff, M.; Bode, M.; Wiesendanger, R.; Kirchheim, R.: Hydrogen induced plastic deformation of thin films. In: Thin Films: Stresses and Mechanical Properties III, pp. 75 - 86 (Eds. Vinci, R. P.; O. Kraft, N.; Moody, N.; Besser, P.; Shaffer, E.). Thin Films: Stresses and Mechanical Properties III. Symposium V at the 1999 MRS Fall Meeting, Boston, Mass., November 29, 1999 - December 03, 1999. Materials Research Society, Warrendale/PA (2000)

Ritley, K. A.; Schreiber, F.; Just, K.-P.; Dosch, H.; Niesen, T. P.; Aldinger, F.: Annealing studies of solution-deposited ZrO₂ thin films on self-assembled monolayers. In: 4th International Conference on Thin Films Physics and Applications, pp. 414 - 417 (Eds. Chu, J.; Liu, P.; Chang, Y.). 4th International Conference on Thin Films Physics and Applications, Shanghai [China], May 05, 2000 - May 11, 2000. (2000)

Ritley, K. A.; Schreiber, F.; Just, K.-P.; Dosch, H.; Niesen, T. P.; Aldinger, F.: Annealing studies of solution-deposited ZrO₂ thin films on self-assembled monolayers. In: 4th International Conference on Thin Films Physics and Applications, pp. 414 - 417 (Eds. Chu, J.; Liu, P.; Chang, Y.). 4th International Conference on Thin Films Physics and Applications, Shanghai [China], May 05, 2000 - May 11, 2000. (2000)

Rühle, M.; Elsässer, C.; Scheu, C.; Sigle, W.: Advanced instrumentations for interface studies by electron energy-loss spectroscopy (EELS, ELNES and ESI)? In: Microscopy and Microanalysis 2000, pp. 188 - 189 (Ed. Bailey, G.W.). Microscopy and Microanalysis 2000, Philadelphia, Pa., August 13, 2000 - August 17, 2000. Springer, New York (2000)

Rühle, M.; Elsässer, C.; Scheu, C.; Sigle, W.: The role of microanalysis in the characterization of interfaces. In: Microbeam Analysis 2000: Proceedings of the Second Conference of the International Union of Microbeam Analysis Societies, pp. 1 - 2 (Eds. Williams, D. B.; Shimizu, R.). Microbeam Analysis 2000. Second Conference of the International Union of Microbeam Analysis Societies, Kailua-Kona, Hawai, July 09, 2000 - July 14, 2007. Institute of Physics Publ., Bristol (2000)