Conference Paper (1609)

7921.
Conference Paper
Kunert, M.; Baretzky, B.; Baker, S. P.; Mittemeijer, E. J.: Submicrometer spatially resolved measurements of mechanical properties and correlation to microstructure and composition. In: Fundamentals of Nanoindentation and Nanotribology II, pp. Q3.2.1 - Q3.2.6 (Eds. Baker, S.P.; Cook, R.F.; Corcoran, S.G.; Moody, N.R.). Fundamentals of Nanoindentation and Nanotribology II. Symposium, Boston, MA, USA, November 28, 2000 - November 30, 2000. MRS, Warrendale, PA, USA (2001)
7922.
Conference Paper
Lach, E.; Dehm, G.; Bartels, A.; Schillinger, W.; Clemens, H.: On the behavior of TiAl alloy under quasistatic and dynamic compression testing. In: Euromat Proceedings, 221.doc (CD-ROM) (Ed. (AIM), A. I. d. M.). (2001)
7923.
Conference Paper
Lejcek, P.; Hofmann, S.: Prediction of enthalpy and entropy of solute segregation in α-iron: a step towards grain boundary engineering of low-alloy-steels. In: Proceedings of the International Workshop on Cleaner Metals for Industrial Exploitation, pp. 146 - 152 (Eds. Lecomte-Beckers; Brozova; A.; Eklund; P. et al.). International Workshop on Cleaner Metals for Industrial Exploitation, Rez Czech Republic, December 16, 1999 - December 17, 1999. Nuclear Research Institute REZ, Czech Republic (2001)
7924.
Conference Paper
Leonhardt, S.; Albrecht, J.; Warthmann, R.; Kronmüller, H.: Enhancement of the critical current density of YBa2Cu3O7-8-films by substracte irradiation. In: High-Tc Superconductors and Related Applications: Materials Science, Fundamental Properties, and Some Future Electronic Applications. Proceedings of the NATO Advanced Study Institute, pp. 529 - 534 (Eds. Drechsler, S.-L.; Mishonov, T.). NATO Advanced Study Institute on High-Tc Superconductors and Related Materials: Materials Science, Fundamental Properties, and Some Future Electronic Applications, Albena, Bulgaria, September 13, 1998 - September 26, 1998. Kluwer Academic Publishers, Dordrecht (2001)
7925.
Conference Paper
Louer, D.; Mittemeijer, E.J.: Powder Diffraction in Materials Science; The Role of Europe. In: European Powder Diffraction EPDIC 7, pp. v - x. European Powder Diffraction Conference, Barcelona, Spain, May 20, 2000 - May 23, 2000. Trans Tech Publications, Zürich-Uetikon (2001)
7926.
Conference Paper
Lück, R.; Gödecke, T.; Beeli, C.: Phase equilibria at internal interfaces of icosahedral Al-Mn-Pd. In: Quasicrystals - Preperation, Properties and Applications, pp. K2.4.1 - K2.4.6 (Eds. Belin-Ferre, E.; Thiel, P.A.; Tsai, A.-P.; Urban, K.). Quasicrystals - Preparation, Properties and Applications, Boston, MA, USA, November 27, 2000 - November 30, 2000. MRS, Warrendale, PA, USA (2001)
7927.
Conference Paper
Lucks, I.; Lamparter, P.; Mittemeijer, E. J.: Diffraction-line profile analysis - A simple way to characterize ball-milled Mo? In: Proceedings of the Seventh European Powder Diffraction Conference, pp. 451 - 456 (Eds. Delhez, R.; Mittemeijer, E.J.). 7th European Powder Diffraction Conference (EPDIC 7), Barcelona, Spain, May 20, 2000 - May 23, 2000. Trans Tech Publications Ltd., Zürich-Uetikon (2001)
7928.
Conference Paper
Lysak, N.; Gumbsch, P.; Wanner, A.: Besonderheiten der Schallemission bei der plastischen Verformung der intermetallischen Phase NiAl (Acoustic emission during plastic deformation of the intermetallic phase NiAl). In: 13. Kolloquium Schallemission, pp. 89 - 100. 13. Kolloquium Schallemission, Jena, Germany, September 27, 2001 - September 28, 2001. DGZfP, Berlin, Germany (2001)
7929.
Conference Paper
Marketz, W.; Chatterjee, A.; Fischer, F. D.; Clemens, H.: Creep of γ-TiAl based alloys - experiments and computational modeling. In: 5th IUTAM Symposium on Creep in Structures, pp. 17 - 30 (Eds. Murakami, S.; Ohno, N.). 5th IUTAM Symposium on Creep in Structures, Nagoya, Japan, April 03, 2000 - April 07, 2000. Kluwer Academic Publishing, Dordrecht (2001)
7930.
Conference Paper
Matics, S.; Frank, W.: Diffusion of gold in the amorphous ceramic Si28C36N36. In: Proceedings of DIMAT 2000, the Fifth International Conference on Diffusion in Materials, pp. 947 - 952 (Ed. Limoge, Y.). 5th International Conference on Diffusion in Materials (DIMAT 2000), Paris, France, July 17, 2000 - July 21, 2000. Scitec Publications Ltd., Uetikon-Zürich (2001)
7931.
Conference Paper
Möbus, G.; Nufer, S.: Is atomic resolution EELS possible? In: Electron microscopy and analysis 2001. Proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, pp. 151 - 154 (Eds. Aindow, M.; Kiely, C. J.). Electron microscopy and analysis 2001, Dundee, UK, September 05, 2001 - September 07, 2001. IOP Publishing Ltd., Bristol (2001)
7932.
Conference Paper
Müller, M. A.; Rempel, A. A.; Reichle, K.; Sprengel, W.; Major, J.; Schaefer, H. E.: Identification of vacancies on each sublattice of SiC by coincident Doppler broadening of the positron annihilation photons after electron irradiation. In: Positron Annihilation. Proceedings of the 12th International Conference on Positron Annihilation, pp. 70 - 72 (Ed. Triftshäuser, W.). 12th International Conference on Positron Annihilation, München, Germany, August 06, 2002 - August 12, 2002. Trans Tech Publications, Zürich-Uetikon (2001)
7933.
Conference Paper
Müller, M. A.; Sprengel, W.; Major, J.; Schaefer, H. E.: Activation volume and chemical environment of atomic vacancies in intermetallic compounds. In: Positron Annihilation. Proceedings of the 12th International Conference on Positron Annihilation, pp. 85 - 87 (Ed. Triftshäuser, W.). 12th International Conference on Positron Annihilation, München, August 06, 2000 - August 12, 2000. Trans Tech Publications Ltd., Zürich-Uetikon (2001)
7934.
Conference Paper
Nufer, S.; Marinopoulos, A. G.; Fabris, S.; Elsässer, C.; Kurtz, W.; Rühle, M.: Microscopic Analysis of Twin Grain Boundaries in Alumina. Microscopy and Microanalysis 2001, Long Beach [CA, USA], August 05, 2001 - August 09, 2001. Proceedings Microscopy and Microanalysis 2001, pp. 312 - 313 (2001)
7935.
Conference Paper
Plachke, D.; Blohm, G.; Fischer, T.; Khellaf, A.; Kruse, O.; Stoll, H.; Carstanjen, H. D.: Ion beam analysis with monolayer depth resolution using the electrostatic spectrometer at the MPI Stuttgart. In: Proceedings of the 16th International Conference on Applications of Accelerators in Research and Industry, pp. 458 - 462 (Eds. Duggan, J.L.; Morgan, I.L.). 16th International Conference on Applications of Accelerators in Research and Industry, Denton, Texas, November 01, 2000 - November 05, 2000. AIP, Melville, New York (2001)
7936.
Conference Paper
Sapalidis, P.; Dodou, D.; Hähner, P.; Zaiser, M.; Aifantis, E. C.: Fluctuation-Induced Nucleation of PLC Bands. In: Influences of interface and dislocation behavior on microstructure evolution, pp. Y8.26.1 - Y8.26.6 (Eds. Aindow, M.; Asta, M.; Glazov, M.V.; Medlin, D.; Zaiser, M.). Influences of interface and dislocation behavior on microstructure evolution, Boston, Massachusetts, USA, November 27, 2000 - November 30, 2000. MRS, Warrendale, Pa. (2001)
7937.
Conference Paper
Scheu, C.; Stein, W.; Klein, S.; Tomsia, A. P.; Rühle, M.: Interfacial chemistry and structure of Cu/al2O3. Proceedings of the Third International Conference HTC-2000, Kurashiki, Japan, November 19, 2000 - November 22, 2000. Transactions of the Joining and Welding Research Institute 30 (Special issue), pp. 223 - 232 (2001)
7938.
Conference Paper
Schillinger, W.; Zhang, D.; Dehm, G.; Clemens, H.: Creep behavior and microstructural stability of lamellar γ-TiAl (Cr, Mo, Si, B) with extremely fine lamellar spacing. In: High-Temperature Ordered Intermetallic Alloys IX, pp. N1.4.1. - N1.4.6. (Eds. Schneidel, J. H.; Hemker, K. J.; Noebe, R. D.; Hanada, S.; Sauthoff, G.). High-Temperature Ordered Intermetallic Alloys IX, Boston, Mass., November 27, 2000 - November 29, 2000. MRS, Warrendale, PA (2001)
7939.
Conference Paper
Schmidt, C.; Dekker, J. P.; Gumbsch, P.; Arzt, E.: A new approach to understanding electromigration in Al(Cu) alloys on an atomistic basis. In: Proceedings of DIMAT 2000, the Fifth International Conference on Diffusion in Materials, pp. 151 - 156 (Ed. Limoge, Y.). 5th International Conference on Diffusion in Materials (DIMAT 2000), Paris, France, July 17, 2000 - July 21, 2000. Scitec Publications Ltd., Uetikon-Zürich (2001)
7940.
Conference Paper
Schmidt, H.; Borchardt, G.; Baumann, H.; Weber, S.; Scherrer, S.; Müller, A.; Bill, J.: Tracer self-diffusion studies in amorphous Si-(B)-C-N ceramics using ion implantation and SIMS. In: Proceedings of DIMAT 2000, the Fifth International Conference on Diffusion in Materials, pp. 941 - 946 (Ed. Limoge, Y.). 5th International Conference on Diffusion in Materials (DIMAT 2000), Paris, France, July 17, 2000 - July 21, 2000. Scitec Publications Ltd., Uetikon-Zürich (2001)
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