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Gu, L.; Sigle, W.; Koch, C. T.; Srot, V.; Nelayah, J.; van Aken, P. A.: Band gap mapping using monochromated electrons. In: EMC2008, 14th European Microscopy Congress, Vol. 1: Instrumentation and Methods, pp. 381 - 382 (Eds. Luysberg, M.; Tillmann, K.; Weirich, T.). 14th European Microscopy Congress, Aachen, Germany, September 01, 2008 - September 05, 2008. Springer, Berlin [et al.] (2008)

Gu, L.; Srot, V.; Sigle, W.; Koch, C.; van Aken, P.: VEELS band gap measurements using monochromated electrons. Electron Microscopy and Analysis Group Conference 2007 (EMAG 2007), Glasgow, UK, September 03, 2007 - September 07, 2007. Journal of Physics: Conference Series 126, 012005, (2008)

Haider, M.; Hartel, P.; Löbau, U.; Höschen, R.; Müller, H.; Uhlemann, S.; Kahl, F.; Zach, J.: Progress on the development of a C_c/C_s corrector for TEAM. Microscopy and Microanalysis 2008, Albuquerque, New Mexico, USA, August 03, 2008 - August 07, 2008. Microscopy and Microanalysis (Supplement S2), pp. 800CD - 801CD (2008)

Hetschel, T.; Wolter, K.-J.; Phillipp, F.: Wettability effects of immersion tin final finishes with lead-free solders. In: 2nd Electronics System-Integration Technology Conference, pp. 561 - 566. 2nd Electronics System-Integration Technology Conference, Greenwich, UK, September 01, 2008 - September 04, 2008. IEEE, Piscataway, NJ (2008)

Höche, T.; Heyroth, F.; van Aken, P. A.; Schrempel, F.; Henderson, G. S.; Blyth, R. I. R.: Amorphisation in fresnoite compounds – a combined ELNES and XANES study. In: EMC2008, 14th European Microscopy Congress, Vol. 2: Materials Science, pp. 821 - 822 (Eds. Richter, S.; Schwedt, A.). 14th European Microscopy Congress, Aachen, Germany, September 01, 2008 - September 05, 2008. Springer, Berlin [et al.] (2008)

Höland, W.; Ritzberger, C.; Rothbrust, F.; Kappert, H.; Rheinberger, V. M.; Krumeich, F.; Nesper, R.; Sigle, W.; van Aken, P. A.: Glass-ceramics and coloured ZrO₂ ceramics for dental restoration. In: "Global Roadmap for Ceramics - ICC2 Proceedings", (on CD-ROM) (Ed. Vincenzini, P.). 2nd International Congress on Ceramics, ICC2, Verona, Italy, June 29, 2008 - July 04, 2008. Institute of Science and Technology for Ceramics - ISTEC-, Faenza, Faenza (2008)

Jin-Phillipp, N. Y.; Nolte, P.; Stierle, A.; van Aken, P. A.; Dosch, H.: Direct observation of surface oxidation of Rh nanoparticles on (001) MgO. In: EMC2008, 14th European Microscopy Congress, Vol. 2: Materials Science, pp. 225 - 226 (Eds. Richter, S.; Schwedt, A.). 14th European Microscopy Congress, Aachen, Germany, September 01, 2008 - September 05, 2008. Springer, Berlin [et al.] (2008)

Jost, M.; Atanasova, P.; Gerstel, P.; Sigle, W.; van Aken, P. A.; Bill, J.: DNA - directed synthesis of ZnO nanowires. In: From Biological Materials to Biomimetic Material Synthesis, pp. DD03 - DD08 (Eds. Kröger, N.; Qiu, R.; Naik Kaplan D., R.). Symposium DD: From Biological Materials to Biomimetic Material Synthesis at MRS Spring Meeting 2008., San Francisco, CA, USA, March 24, 2008 - March 28, 2008. Materials Research Society, Warrendale, PA, USA (2008)

Koch, C. T.; Bellina, P.; van Aken, P. A.: Software precession electron diffraction. In: EMC2008, 14th European Microscopy Congress, Vol. 1: Instrumentation and Methods, pp. 201 - 202 (Eds. Luysberg, M.; Tillmann, K.; Weirich, T.). 14th European Microscopy Congress, Aachen, Germany, September 01, 2008 - September 05, 2008. Springer, Berlin [et al.] (2008)

Koch, C. T.; Rahmati, B.; van Aken, P. A.: Nonlinear electron inline holography. In: EMC2008, 14th European Microscopy Congress, Vol. 1: Instrumentation and Methods, pp. 261 - 264 (Eds. Luysberg, M.; Tillmann, K.; Weirich, T.). 14th European Microscopy Congress, Aachen, Germany, September 01, 2008 - September 05, 2008. Springer, Berlin [et al.] (2008)

Koch, C. T.; Sigle, W.; Nelayah, J.; Gu, L.; Srot, V.; van Aken, P. A.: Sub-0.5 eV EFTEM mapping using the Zeiss SESAM. In: EMC2008, 14th European Microscopy Congress, Vol. 1: Instrumentation and Methods, pp. 447 - 448 (Eds. Luysberg, M.; Tillmann, K.; Weirich, T.). 14th European Microscopy Congress, Aachen, Germany, September 01, 2008 - September 05, 2008. Springer, Berlin [et al.] (2008)

Laszcz, A.; Ratajczak, J.; Czerwinski, A.; Katcki, J.; Srot, V.; Phillipp, F.; van Aken, P. A.; Breil, N.; Larrieu, G.; Dubois, E.: Transmission electron microscopy study of the platinum germanide formation process in the Ge/Pt/Ge/SiO₂/Si structure. E-MRS Spring Meeting 2008, Strasbourg, France, May 26, 2008 - May 30, 2008. Materials Science and Engineering B 154–155, pp. 175 - 178 (2008)

Liu, Z.; Srot, V.; van Aken, P. A.; Rühle, M.; Yang, C. T.: Silicon carbide nanowire heterostructures constructed from released iron catalysis. In: Nanowires—Novel Assembly Concepts and Device Integration, 1058-JJ04-02 (Ed. Mayer, T. S.). MRS Fall Meeting 2007, Boston, MA, USA, November 26, 2007 - November 30, 2007. Materials Research Society, Warrendale, PA, USA (2008)

Maempel, J.; Andrada, E.; Trommer, C.; Karguth, A.; Fischer, M.; Voigt, D.; Gorb, S. N.: Inspirat - towards a biologially inspired climbing robot for the inspection of linear structures. In: Advances in Mobile Robotics: Proceedings of the Eleventh International Conference on Climbing and Walking Robots and the Support Technologies for Mobile Machines, pp. 207 - 213 (Ed. Marques, L.). International Conference on Climbing and Walking Robots and the Support Technologies for Mobile Machines, Coimbra [Portugal], September 08, 2008 - September 10, 2008. World Scientific, Singapore [et al.] (2008)

Meng, Y.; Nolze, G.; Zhang, W. Z.; Gu, L.; van Aken, P. A.: Determination of precise orientation relationships between surface precipitates and matrix in a duplex stainless steel. In: EMC2008, 14th European Microscopy Congress, Vol. 2: Materials Science, pp. 659 - 660 (Eds. Richter, S.; Schwedt, A.). 14th European Microscopy Congress, Aachen, Germany, September 01, 2008 - September 05, 2008. Springer, Berlin [et al.] (2008)

Näfe, H.: Thermodynamic characterization of reference electrode systems for galvanic cells comprising alkali ion conducting solid electrolyte. 214th Meeting of the Electrochemical Society, Honolulu, HI, USA, October 12, 2008 - October 17, 2008. ECS Transactions 16 (11), pp. 517 - 527 (2008)

Nelayah, J.; Gu, L.; Sigle, W.; Koch, C. T.; Pastoriza-Santos, L.; Liz-Marzan, L. M.; van Aken, P. A.: Low-loss-energy EFTEM imaging of triangular silver nanoparticles. In: EMC2008, 14th European Microscopy Congress, Vol. 2: Materials Science, pp. 243 - 244 (Eds. Richter, S.; Schwedt, A.). 14th European Microscopy Congress, Aachen, Germany, September 01, 2008 - September 05, 2008. Springer, Berlin [et al. (2008)

Özdöl, V. B.; Phillipp, F.; Kasper, E.; van Aken, P. A.: Quantitative local strain analysis of Si/SiGe heterostructures using HRTEM. In: EMC2008, 14th European Microscopy Congress, Vol. 1: Instrumentation and Methods, pp. 141 - 142 (Eds. Luysberg, M.; Tillmann, K.; Weirich, T.). 14th European Microscopy Congress, Aachen, Germany, September 01, 2008 - September 05, 2008. Springer, Berlin [et al.] (2008)

Phillipp, F.; Bellina, P. J.; Lee, S. B.; Messer, R.; van Aken, P. A.: In-situ atomic resolution HVEM studies of strontium titanate at high temperatures. The 9th Asia-Pacific Microscopy Conference (APMC9), Jeju, South Korea, November 02, 2008 - November 07, 2008. Korean Journal of Microscopy 38 (4, Supplement), pp. 102 - 103 (2008)