Konferenzbeitrag (12583)

93581.
Konferenzbeitrag
Leggieri, A.; Albajar, F.; Alberti, S.; Avramidis, K. A.; Bariou, D.; Bin, W.; Bruschi, A.; Chelis, I.; Difonzo, R.; Ell, B. et al.; Fanale, F.; Feuerstein, L.; Gajetti, E.; Gantenbein, G.; Genoud, J.; Goodman, T. P.; Hogge, J.-P.; Illy, S.; Ioannidis, Z.; Jelonnek, J.; Jin, J.; Kohler, S.; Latsas, G.; Laqua, H.; Legrand, F.; Lievin, C.; Marchesin, R.; Marek, A.; Marsen, S.; Noke, F.; Peponis, D.; Ponomarenko, S.; Ruess, T.; Rzesnicki, T.; Sanchez, F.; Savoldi, L.; Stanculovic, S.; Stange, T.; Tigelis, I.; Torreblanca, H.; Vallee, E.; Wolf, R.; Zelkas, A.; Thumm, M.: Progress of European Industrial Gyrotron Developments for Nuclear Fusion. In: 2023 24th International Vacuum Electronics Conference (IVEC). 24th International Vacuum Electronics Conference (IVEC), Chengdu, 25. April 2023 - 28. April 2023. IEEE, New York, NY (2023)
93582.
Konferenzbeitrag
Li, C.; Morel-Forster, A.; Vetter, T.; Egger, B.; Kortylewski, A.: Robust Model-based Face Reconstruction through Weakly-Supervised Outlier Segmentation. In: IEEE/CVF Conference on Computer Vision and Pattern Recognition, S. 372 - 381. 36th IEEE/CVF Conference on Computer Vision and Pattern Recognition, Vancouver, Canada, 18. Juni 2023 - 22. Juni 2023. IEEE, Piscataway, NJ (2023)
93583.
Konferenzbeitrag
Li, J.; Nanongkai, D.; Panigrahi, D.; Saranurak, T.: Near-Linear Time Approximations for Cut Problems via Fair Cuts. In: Proceedings of the 2023 Annual ACM-SIAM Symposium on Discrete Algorithms, S. 240 - 257 (Hg. Bansal, N.; Nagarajan, V.). Annual ACM-SIAM Symposium on Discrete Algorithms, Florence, Italy, 22. Januar 2023 - 25. Januar 2023. SIAM, Philadelphia, PA (2023)
93584.
Konferenzbeitrag
Li, K.; Dai, D.; Van Gool, L.: Jointly Learning Band Selection and Filter Array Design for Hyperspectral Imaging. In: 2023 IEEE Winter Conference on Applications of Computer Vision, S. 6373 - 6383. IEEE Winter Conference on Applications of Computer Vision, Waikoloa Village, HI, USA, 03. Januar 2023 - 07. Januar 2023. IEEE, Piscataway, NJ (2023)
93585.
Konferenzbeitrag
Li, Y.; Zhang, D.; Keuper, M.; Khoreva, A.: Intra-Source Style Augmentation for Improved Domain Generalization. In: 2023 IEEE Winter Conference on Applications of Computer Vision, S. 509 - 519. IEEE Winter Conference on Applications of Computer Vision, Waikoloa Village, HI, USA, 03. Januar 2023 - 07. Januar 2023. IEEE, Piscataway, NJ (2023)
93586.
Konferenzbeitrag
Li, Z.; Wang, X.; Stengel-Eskin, E.; Kortylewski, A.; Ma, W.; Van Durme, B.; Yuille, A.: Super-CLEVR: A Virtual Benchmark to Diagnose Domain Robustness in Visual Reasoning. In: IEEE/CVF Conference on Computer Vision and Pattern Recognition, S. 14963 - 14973. 36th IEEE/CVF Conference on Computer Vision and Pattern Recognition, Vancouver, Canada, 18. Juni 2023 - 22. Juni 2023. IEEE, Piscataway, NJ (2023)
93587.
Konferenzbeitrag
Liao, K.; Tricard, T.; Piovarči, M.; Seidel, H.-P.; Babaei, V.: Learning Deposition Policies for Fused Multi-Material 3D Printing. In: IEEE International Conference on Robotics and Automation, S. 12345 - 12352. IEEE International Conference on Robotics and Automation, London, UK, 29. Mai 2023 - 02. Juni 2023. IEEE, Piscataway, NJ (2023)
93588.
Konferenzbeitrag
Lim, H.; Kim, J.; Cho, I.; Jang, K.; Bai, W.; Han, D.: FlexPass: A Case for Flexible Credit-based Transport for Datacenter Networks. In: EuroSys '23, S. 606 - 622 (Hg. Di Luna, G. A.; Querzoni, L.; Fedorova, A.; Narayanan, D.). Eighteenth European Conference on Computer Systems, Rome, Italy, 08. Mai 2023 - 12. Mai 2023. ACM, New York, NY (2023)
93589.
Konferenzbeitrag
Ling, C.; Gummadi, K.; Zannettou, S.: "Learn the Facts About COVID-19": Analyzing the Use of Warning Labels on TikTok Videos. In: Proceedings of the Seventeenth International AAAI Conference on Web and Social Media, S. 554 - 565 (Hg. Lin, Y.-R.; Cha, M.; Quercia, D.). 17th International AAAI Conference on Web and Social Media, Limassol, Cyprus, 05. Juni 2023 - 08. Juni 2023. AAAI, Washington, DC (2023)
93590.
Konferenzbeitrag
Liu, Q.; Kortylewski, A.; Yuille, A.: PoseExaminer: Automated Testing of Out-of-Distribution Robustness in Human Pose and Shape Estimation. In: IEEE/CVF Conference on Computer Vision and Pattern Recognition, S. 672 - 681. 36th IEEE/CVF Conference on Computer Vision and Pattern Recognition, Vancouver, Canada, 18. Juni 2023 - 22. Juni 2023. IEEE, Piscataway, NJ (2023)
93591.
Konferenzbeitrag
Liu, Y.; Li, Y.; Schiele, B.; Sun, Q.: Online Hyperparameter Optimization for Class-Incremental Learning. In: Proceedings of the 37th AAAI Conference on Artificial Intelligence, S. 8906 - 8913. 37th AAAI Conference on Artificial Intelligence, Washington, DC, USA, 07. Februar 2023 - 14. Februar 2023. AAAI, Palo Alto, CA (2023)
93592.
Konferenzbeitrag
Liu, Y.; Schiele, B.; Vedaldi, A.; Rupprecht, C.: Continual Detection Transformer for Incremental Object Detection. In: IEEE/CVF Conference on Computer Vision and Pattern Recognition, S. 23799 - 23808. 36th IEEE/CVF Conference on Computer Vision and Pattern Recognition, Vancouver, Canada, 18. Juni 2023 - 23. Juni 2023. IEEE, Piscataway, NJ (2023)
93593.
Konferenzbeitrag
Lotz, K.; Goel, A.; Dutertre, B.; Kiesl-Reiter, B.; Kong, S.; Majumdar, R.; Nowotka, D.: Solving String Constraints Using SAT. In: Computer Aided Verification, S. 187 - 208 (Hg. Enea, C.; Lal, A.). 35th International Conference on Computer-Aided Verification, Paris, France, 17. Juli 2023 - 22. Juli 2023. Springer, Berlin (2023)
93594.
Konferenzbeitrag
Lotz, K.; Goel, A.; Dutertre, B.; Kiesl-Reiter, B.; Kong, S.; Majumdar, R.; Nowotka, D.: Making IP = PSPACE Practical: Efficient Interactive Protocols for BDD Algorithms. In: Computer Aided Verification, S. 437 - 458 (Hg. Enea, C.; Lal, A.). 35th International Conference on Computer-Aided Verification, Paris, France, 17. Juli 2023 - 22. Juli 2023. Springer, Berlin (2023)
93595.
Konferenzbeitrag
Lukin, K.; Khutoryan, E.; Cerdeira, H. A.; Kuleshov, A.; Yurchenko, L.; Ponomarenko, S.: Current Instabilities in Vacuum Electron Devices and Semiconductor Avalanche Diodes for Generation of THz Oscillations. In: 2023 International Conference on Optical MEMS and Nanophotonics (OMN) and SBFoton International Optics and Photonics Conference (SBFoton IOPC). International Conference on Optical MEMS and Nanophotonics (OMN) / SBFoton International Optics and Photonics Conference (SBFoton IOPC), Campinas, 31. Juli 2023 - 03. August 2023. IEEE, New York, NY (2023)
93596.
Konferenzbeitrag
Luo, Z.; Liu, Y.; Schiele, B.; Sun, Q.: Class-Incremental Exemplar Compression for Class-Incremental Learning. In: 36th IEEE/CVF Conference on Computer Vision and Pattern Recognition, S. 11371 - 11380. 36th IEEE/CVF Conference on Computer Vision and Pattern Recognition, Vancouver, Canada, 18. Juni 2023 - 23. Juni 2023. IEEE, Piscataway, NJ (2023)
93597.
Konferenzbeitrag
Maghsoudlou, A.; Vermeulen, L.; Poese, I.; Gasser, O.: Characterizing the VPN Ecosystem in the Wild. In: Passive and Active Measurement, S. 18 - 45 (Hg. Brunstrom, A.; Flores, M.; Fiore, M.). 24th International Conference on Passive and Active Measurement , Virtual Event, 21. März 2023 - 23. März 2023. Springer, Berlin (2023)
93598.
Konferenzbeitrag
Majumdar, R.; Mallik, K.; Rychlicki, M.; Schmuck, A.-K.; Soudjani, S.: Poster Abstract: A Toolchain for Accelerated Symbolic Control. In: HSCC 2023, 28, S. 1 - 2. 26th ACM International Conference on Hybrid Systems: Computation and Control, San Antonio, TX, USA, 10. Mai 2023 - 12. Mai 2023. ACM, New York, NY (2023)
93599.
Konferenzbeitrag
Majumdar, R.; Mallik, K.; Rychlicki, M.; Schmuck, A.-K.; Soudjani, S.: A Flexible Toolchain for Symbolic Rabin Games under Fair and Stochastic Uncertainties. In: Computer Aided Verification, S. 3 - 15 (Hg. Enea, C.; Lal, A.). 35th International Conference on Computer-Aided Verification, Paris, France, 17. Juli 2023 - 22. Juli 2023. Springer, Berlin (2023)
93600.
Konferenzbeitrag
Mandal, D.; Radanovic, G.; Gan, J.; Singla, A.; Majumdar, R.: Online Reinforcement Learning with Uncertain Episode Lengths. In: Proceedings of the 37th AAAI Conference on Artificial Intelligence, S. 9064 - 9071. 37th AAAI Conference on Artificial Intelligence, Washington, DC, USA, 07. Februar 2023 - 14. Februar 2023. AAAI, Palo Alto, CA (2023)
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