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Hertel, R.; Kronmüller, H.: Irreversible magnetization processes in a soft magnetic platelet. Physica B 275, pp. 1 - 4 (2000)

Hirscher, M.; Brossmann, U.; Henes, R.: Measurement of the Zener relaxation in high-purity FeCr single crystals. Materials Transactions, JIM 41, pp. 82 - 86 (2000)

Hofmann, S.: Ultimate depth resolution and profile reconstruction in sputter profiling with AES and SIMS. Surface and Interface Analysis 30, pp. 228 - 233 (2000)

Holloway, B. C.; Kraft, O.; Shuh, D. K.; Nix, W. D.; Kelly, M.; Pianetta, P.; Hagström, S.: The role of delocalized nitrogen in determining the local atomic arrangement and mechanical properties of amorphous carbon nitride thin films. Journal of Vacuum Science and Technology A 18, pp. 2964 - 2971 (2000)

Hörz, G.; Kallfass, M.: The treasure of gold and silver artifacts from the Royal Tombs of Sipan, Peru - a study on the Moche metalworking techniques. 4-5, pp. 391 - 420 (2000)

Hsu, W. K.; Chang, B. H.; Zhu, Y. Q.; Han, W. Q.; Terrones, H.; Terrones, M.; Grobert, N.; Cheetham, A. K.; Kroto, H. W.; Walton, D. R. M.: An alternative route to molybdenum disulfide nanotubes. Journal of the American Chemical Society 122, pp. 10155 - 10158 (2000)

Hsu, W. K.; Firth, S.; Redlich, P.; Terrones, M.; Terrones, H.; Zhu, Y. Q.; Grobert, N.; Schilder, A.; Clark, R. J. H.; Kroto, H. W. et al.; Walton, D. R. M.: Boron-doping effects in carbon nanotubes. Journal of Materials Chemistry 10, pp. 1425 - 1429 (2000)

Hsu, W. K.; Zhu, Y. Q.; Kroto, H. W.; Walton, D. R. M.; Kamalakaran, R.; Terrones, M.: C-MoS₂ and C-WS₂ nanocomnposites. Applied Physics Letters 77 (25), pp. 4130 - 4132 (2000)

Ijima, T.; Näfe, H.; Aldinger, F.: Ferroelectric properties of Al and Nb doped PbTiO₃. Integrated Ferroelectrics 30 (1-4), pp. 9 - 17 (2000)

Ischenko, T. V.; Demishev, S. V.; Gust, W.: Investigation of the phase formation wave in the model of solid state amorphization. Computational Materials Science 17, pp. 331 - 335 (2000)

Izhevskiy, V.A.; Genova, L.A.; Bressiani, J.C.; Aldinger, F.: Progress in SiAlON ceramics. (submitted)

Jacob, K. T.; Dasgupta, N.; Näfe, H.; Aldinger, F.: Measurement of Gibbs energy of formation of LaGaO₃ using a composition-graded solid electrolyte. Journal of Materials Research 15, pp. 2836 - 2843 (2000)

Jeurgens, L. P. H.; Sloof, W. G.; Tichelaar, C. G.; Mittemeijer, E. J.: Determination of total primary zero loss intensities in measured electron emission spectra of bare and oxidized metals. Application to aluminium oxide films on aluminium substrates. Applied Surface Science 161, pp. 139 - 148 (2000)

Jeurgens, L. P. H.; Sloof, W. G.; Tichelaar, C. G.; Mittemeijer, E. J.: Thermodynamic stability of amorphous oxide films on metals: Application to aluminium oxide films on aluminium substrates. Physical Review B 62, pp. 4707 - 4719 (2000)

Jin-Phillipp, N. Y.; Phillipp, F.: Strain distribution in self-assembled InP/GaInP quantum dots. Journal of Applied Physics 88, pp. 710 - 715 (2000)

Jooss, C.; Warthmann, R.; Kronmüller, H.: Pinning mechanism of vortices at antiphase boundaries in YBa₂Cu₃O_7-δ. Physical Review B 61, pp. 12433 - 12446 (2000)

Kamalakaran, R.; Terrones, M.; Seeger, T.; Kohler-Redlich, P.; Rühle, M.; Kim, Y. A.; Hayashi, T.; Endo, M.: Synthesis of thick and crystalline nanotube arrays by spray pyrolysis. Applied Physics Letters 77, pp. 3385 - 3387 (2000)

Kamminga, J.-D.; de Keijser, T. H.; Mittemeijer, E. J.; Delhez, R.: New methods for diffraction stress measurement: A critical evaluation of new and existing methods. Journal of Applied Crystallography 33, pp. 1059 - 1066 (2000)

Kamminga, J.-D.; Delhez, R.; de Keijser, T. H.; Mittemeijer, E. J.: A tool for X-ray diffraction analysis of thin layers on substrates: Substrate peak removal method. Journal of Applied Crystallography 33, pp. 108 - 111 (2000)