Konferenzbeitrag (1394)

7401.
Konferenzbeitrag
Katcki, J.; Ratajczak, J.; Phillipp, F.; Bugajski, M.; Muszalski, J.: Electron microscopy study of vertical cavity surface emitting lasers. In: Microscopy of Semiconducting Materials 2001. Proceedings of the Royal Microscopical Society Conference, S. 493 - 496 (Hg. Cullis, A.G.). Microscopy of Semiconducting Materials, Oxford, UK, 25. März 2001 - 29. März 2001. IOP Publishing Ltd., Bristol (2001)
7402.
Konferenzbeitrag
Kilo, M.; Weller, M.; Borchardt, G.; Damson, B.; Weber, S.; Scherrer, S.: Cation mobility in Y2O3- and CaO-stabilised ZrO2 studied by tracer diffusion and mechanical spectroscopy. In: Proceedings of DIMAT 2000, the Fith International Conference on Diffusion in Materials, S. 1039 - 1044 (Hg. Limoge, Y.). 5th International Conference on Diffusion in Materials (DIMAT 2000), Paris, France, 17. Juli 2000 - 21. Juli 2000. Scitec Publications Ltd., Uetikon-ZĂĽrich (2001)
7403.
Konferenzbeitrag
Klugkist, P.; Aleshin, A. N.; Lojkowski, W.; Shvindlerman, L. S.; Gust, W.; Mittemeijer, E. J.: Pressure and orientation dependence of Zn diffusion along < 001 > tilt grain boundaries in Al bicrystals. In: Proceedings of DIMAT 2000, the Fifth International Conference on Diffusion in Materials, S. 1153 - 1159 (Hg. Limoge, Y.). 5th International Conference on Diffusion in Materials (DIMAT 2000), Paris, France, 17. Juli 2000 - 21. Juli 2000. Scitec Publications Ltd., Uetikon-ZĂĽrich (2001)
7404.
Konferenzbeitrag
KronmĂĽller, H.; Hertel, R.: Computational micromagnetism of magnetic structures and magnetization processes in thin plantelets and small particles. In: Magnetic Storage Sstems Beyond 2000, S. 345 - 362 (Hg. Hadjipanayis, G.C.). NATO Advanced Study Institute on Magnetic Storage Sstems Beyond 2000, Rhodos, Greece, 25. Juni 2000 - 07. Juli 2000. Kluwer Academic Publishers, Dordrecht, Netherlands (2001)
7405.
Konferenzbeitrag
Kugimiya, T.; Shibutani, Y.; Gumbsch, P.: Crack-tip field analyses of silicon using order (N) tight-binding method. In: Materials Science for the 21st Century. Vol. B, S. 285 - 288. Materials Science for the 21st Century, Osaka, Japan, 21. Mai 2001 - 26. Mai 2001. (2001)
7406.
Konferenzbeitrag
Kunert, M.; Baretzky, B.; Baker, S. P.; Mittemeijer, E. J.: Submicrometer spatially resolved measurements of mechanical properties and correlation to microstructure and composition. In: Fundamentals of Nanoindentation and Nanotribology II, S. Q3.2.1 - Q3.2.6 (Hg. Baker, S.P.; Cook, R.F.; Corcoran, S.G.; Moody, N.R.). Fundamentals of Nanoindentation and Nanotribology II. Symposium, Boston, MA, USA, 28. November 2000 - 30. November 2000. MRS, Warrendale, PA, USA (2001)
7407.
Konferenzbeitrag
Lach, E.; Dehm, G.; Bartels, A.; Schillinger, W.; Clemens, H.: On the behavior of TiAl alloy under quasistatic and dynamic compression testing. In: Euromat Proceedings, 221.doc (CD-ROM) (Hg. (AIM), A. I. d. M.). (2001)
7408.
Konferenzbeitrag
Lejcek, P.; Hofmann, S.: Prediction of enthalpy and entropy of solute segregation in α-iron: a step towards grain boundary engineering of low-alloy-steels. In: Proceedings of the International Workshop on Cleaner Metals for Industrial Exploitation, S. 146 - 152 (Hg. Lecomte-Beckers; Brozova; A.; Eklund; P. et al.). International Workshop on Cleaner Metals for Industrial Exploitation, Rez Czech Republic, 16. Dezember 1999 - 17. Dezember 1999. Nuclear Research Institute REZ, Czech Republic (2001)
7409.
Konferenzbeitrag
Leonhardt, S.; Albrecht, J.; Warthmann, R.; KronmĂĽller, H.: Enhancement of the critical current density of YBa2Cu3O7-8-films by substracte irradiation. In: High-Tc Superconductors and Related Applications: Materials Science, Fundamental Properties, and Some Future Electronic Applications. Proceedings of the NATO Advanced Study Institute, S. 529 - 534 (Hg. Drechsler, S.-L.; Mishonov, T.). NATO Advanced Study Institute on High-Tc Superconductors and Related Materials: Materials Science, Fundamental Properties, and Some Future Electronic Applications, Albena, Bulgaria, 13. September 1998 - 26. September 1998. Kluwer Academic Publishers, Dordrecht (2001)
7410.
Konferenzbeitrag
Louer, D.; Mittemeijer, E.J.: Powder Diffraction in Materials Science; The Role of Europe. In: European Powder Diffraction EPDIC 7, S. v - x. European Powder Diffraction Conference, Barcelona, Spain, 20. Mai 2000 - 23. Mai 2000. Trans Tech Publications, ZĂĽrich-Uetikon (2001)
7411.
Konferenzbeitrag
Lück, R.; Gödecke, T.; Beeli, C.: Phase equilibria at internal interfaces of icosahedral Al-Mn-Pd. In: Quasicrystals - Preperation, Properties and Applications, S. K2.4.1 - K2.4.6 (Hg. Belin-Ferre, E.; Thiel, P.A.; Tsai, A.-P.; Urban, K.). Quasicrystals - Preparation, Properties and Applications, Boston, MA, USA, 27. November 2000 - 30. November 2000. MRS, Warrendale, PA, USA (2001)
7412.
Konferenzbeitrag
Lucks, I.; Lamparter, P.; Mittemeijer, E. J.: Diffraction-line profile analysis - A simple way to characterize ball-milled Mo? In: Proceedings of the Seventh European Powder Diffraction Conference, S. 451 - 456 (Hg. Delhez, R.; Mittemeijer, E.J.). 7th European Powder Diffraction Conference (EPDIC 7), Barcelona, Spain, 20. Mai 2000 - 23. Mai 2000. Trans Tech Publications Ltd., ZĂĽrich-Uetikon (2001)
7413.
Konferenzbeitrag
Lysak, N.; Gumbsch, P.; Wanner, A.: Besonderheiten der Schallemission bei der plastischen Verformung der intermetallischen Phase NiAl (Acoustic emission during plastic deformation of the intermetallic phase NiAl). In: 13. Kolloquium Schallemission, S. 89 - 100. 13. Kolloquium Schallemission, Jena, Germany, 27. September 2001 - 28. September 2001. DGZfP, Berlin, Germany (2001)
7414.
Konferenzbeitrag
Marketz, W.; Chatterjee, A.; Fischer, F. D.; Clemens, H.: Creep of Îł-TiAl based alloys - experiments and computational modeling. In: 5th IUTAM Symposium on Creep in Structures, S. 17 - 30 (Hg. Murakami, S.; Ohno, N.). 5th IUTAM Symposium on Creep in Structures, Nagoya, Japan, 03. April 2000 - 07. April 2000. Kluwer Academic Publishing, Dordrecht (2001)
7415.
Konferenzbeitrag
Matics, S.; Frank, W.: Diffusion of gold in the amorphous ceramic Si28C36N36. In: Proceedings of DIMAT 2000, the Fifth International Conference on Diffusion in Materials, S. 947 - 952 (Hg. Limoge, Y.). 5th International Conference on Diffusion in Materials (DIMAT 2000), Paris, France, 17. Juli 2000 - 21. Juli 2000. Scitec Publications Ltd., Uetikon-ZĂĽrich (2001)
7416.
Konferenzbeitrag
Möbus, G.; Nufer, S.: Is atomic resolution EELS possible? In: Electron microscopy and analysis 2001. Proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, S. 151 - 154 (Hg. Aindow, M.; Kiely, C. J.). Electron microscopy and analysis 2001, Dundee, UK, 05. September 2001 - 07. September 2001. IOP Publishing Ltd., Bristol (2001)
7417.
Konferenzbeitrag
Müller, M. A.; Rempel, A. A.; Reichle, K.; Sprengel, W.; Major, J.; Schaefer, H. E.: Identification of vacancies on each sublattice of SiC by coincident Doppler broadening of the positron annihilation photons after electron irradiation. In: Positron Annihilation. Proceedings of the 12th International Conference on Positron Annihilation, S. 70 - 72 (Hg. Triftshäuser, W.). 12th International Conference on Positron Annihilation, München, Germany, 06. August 2002 - 12. August 2002. Trans Tech Publications, Zürich-Uetikon (2001)
7418.
Konferenzbeitrag
Müller, M. A.; Sprengel, W.; Major, J.; Schaefer, H. E.: Activation volume and chemical environment of atomic vacancies in intermetallic compounds. In: Positron Annihilation. Proceedings of the 12th International Conference on Positron Annihilation, S. 85 - 87 (Hg. Triftshäuser, W.). 12th International Conference on Positron Annihilation, München, 06. August 2000 - 12. August 2000. Trans Tech Publications Ltd., Zürich-Uetikon (2001)
7419.
Konferenzbeitrag
Nufer, S.; Marinopoulos, A. G.; Fabris, S.; Elsässer, C.; Kurtz, W.; Rühle, M.: Microscopic Analysis of Twin Grain Boundaries in Alumina. Microscopy and Microanalysis 2001, Long Beach [CA, USA], 05. August 2001 - 09. August 2001. Proceedings Microscopy and Microanalysis 2001, S. 312 - 313 (2001)
7420.
Konferenzbeitrag
Plachke, D.; Blohm, G.; Fischer, T.; Khellaf, A.; Kruse, O.; Stoll, H.; Carstanjen, H. D.: Ion beam analysis with monolayer depth resolution using the electrostatic spectrometer at the MPI Stuttgart. In: Proceedings of the 16th International Conference on Applications of Accelerators in Research and Industry, S. 458 - 462 (Hg. Duggan, J.L.; Morgan, I.L.). 16th International Conference on Applications of Accelerators in Research and Industry, Denton, Texas, 01. November 2000 - 05. November 2000. AIP, Melville, New York (2001)
Zur Redakteursansicht