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Weller, M.; Damson, B.; Feuerbacher, M.: Defects and diffusion in d-AlNiCo-quasicrystals - application of mechanical spectroscopy. 6th International Conference on Diffusion in Materials, DIMAT2004, Cracow [Poland], 18. Juli 2004 - 23. Juli 2004. Diffusion in Materials - DIMAT2004, S. 322 - 327 (2005)

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Wu, Y. C.; Sprengel, W.; Reimann, K.; Reichle, K. J.; Goll, D.; Würschum, R.; Schaefer, H. E.: Defects distribution of Pr₂Fe₁₄B hard magnetic magnet from amorphous to nanostructures characterized by positron annihilation spectroscopy. In: PRICM 5. Proceedings of the Fifth Pacific RIM International Conference on Advanced Materials and Processing, S. 2123 - 2126 (Hg. Saka, H.; Kim, T. H.; Holm, E. A.; Han, Y. F.; Xie, X. S.). PRICM 5: The Fifth Pacific RIM International Conference on Advanced Materials and Processing, Beijing, China, 02. November 2004 - 05. November 2004. Trans Tech, Uetikon-Zürich (2005)

Wübben, T.; Dehm, G.; Arzt, E.: Influence of gas atmosphere on the plasticity of metal thin films. In: Thin Films—Stresses and Mechanical Properties XI, S. O6.5.1 - O6.5.6 (Hg. Buchheit; E., T.; Minor; M., A.; Spolenak et al.). MRS Spring Meeting 2005/Nanoscale and Interfacial Phenomena and Related Materials/Thin Films―Stresses and Mechanical Properties XI, San Francisco, CA, USA, 28. März 2005 - 01. April 2005. MRS, Warrendale, PA (2005)

Zhou, L.; Rixecker, G.; Zimmermann, A.; Aldinger, F.: Composition dependent fatigue in antiferroelectric PZST ceramics induced by bipolar electric cycling. In: PRICM-5. Proceedings of the 5th Pacific RIM International Conference on Advanced Materials and Processing, S. 1193 - 1196. 5th Pacific Rim International Conference on Advanced Materials and Processing, Beijing, 02. November 2004 - 05. November 2004. Trans Tech, Zürich-Aedermannsdorf (2005)

Jin-Phillipp, N.Y.; Kelsch, M.; Sycha, M.; Thomas, J.; Rühle, M.: Cross-sectional TEM study on metal/carbon nanotube interface. In: Proceedings Microscopy and Microanalysis 2004, Suppl. 2, S. 280CD - 281CD (Hg. Anderson, I.M.; Price, R.; Hall, E.; Clark, E.; McKernan, S.). Microscopy and Microanalysis 2004, Savannah, Georgia, USA, 01. August 2004 - 05. August 2004. Press Syndicate of the University of Cambridge, New York, USA (2004)

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Richter, G.; Schmidt, S.; Sigle, W.; Rühle, M.: HRTEM studies of segregated Ga at the Al Σ11 (113) [1ˉ10] symmetrical tilt grain boundary. Microscopy and Microanalysis 2004, Savannah, Georgia, USA, 01. August 2004 - 05. August 2004. Proceedings Microscopy and Microanalysis 2004, S. 282CD - 283CD (2004)

Rühle, M.; Oh, S.-H.; Scheu, C.; Wagner, T.: Control of bonding at the Cu(0001) α-Al₂O₃ interface. In: Proceedings Microscopy and Microanalysis 2004, S. 10 - 11 (Hg. Anderson, I.M.; Price, R.; Hall, E.; Clark, E.; McKernan, S.). Microscopy and Microanalysis 2004, Savannah, Georgia, USA, 01. August 2004 - 05. August 2004. Press Syndicate of the University of Cambridge, New York, USA (2004)

Tchernychova, E.; Scheu, C.; Sturm, S.; Richter, G.; Wagner, T.; Rühle, M.: Atomic structure and bonding distance at the Pd/SrTiO₃(001) interface. In: Proceedings Microscopy and Microanalysis 2004, Suppl. 2, S. 278CD - 279CD (Hg. Anderson, I.M.; Price, R.; Hall, E.; Clark, E.; McKernan, S.). Microscopy and Microanalysis 2004, Savannah, Georgia, USA, 01. August 2004 - 05. August 2004. Press Syndicate of the University of Cambridge, New York, USA (2004)

Barabash, R. I.; Ice, G. E.; Tamura, N.; Valek, B. C.; Spolenak, R.; Bravman, J. C.; Patel, J. R.: Coupling between precipitation and plastic deformation during electromigration in a passivated Al (0.5wt%Cu) interconnect. In: Materials, Technology, Annealability for Advanced Interconnects and Low-k Dieelectrics, S. F7.4.1 - F7.4.10 (Hg. Carter, R.; Hau-Riege, C.; Kloster, G.; Lu, T.-M.; Schulz, S.). Materials, Technology, Annealability for Advanced Interconnects and Low-k Dieelectrics. Symposium at the MRS Spring Meeting 2004, San Francisco, 12. April 2004 - 16. April 2004. Materials Research Society (2004)

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Gruber, P.; Böhm, J.; Wanner, A.; Sauter, L.; Spolenak, R.; Arzt, E.: Size effect on crack formation in Cu/Ta and Ta/Cu/Ta thin film systems. In: Nanoscale Materials and Modeling-Relations Among Processing, Microstructure and Mechanical Properties, S. P.2.7.1 - P.2.7.7 (Hg. Anderson, P.M.; Foecke, T.; Misra, A.; Rudd, R.E.). Nanoscale Materials and Modeling-Relations Among Processing, Microstructure and Mechanical Properties . Symposium at the MRS Spring Meeting 2004, San Francisco, 12. April 2004 - 16. April 2004. Materials Research Society, Boston (2004)

Oh, S. H.; Scheu, C.; Dehm, G.; Wagner, T.; Rühle, M.; Lee, H. J.: Direct atomic-scale observation of dynamic alumina - aluminum solid - liquid interfaces. In: Proceedings of the 8th Asia-Pacific Conference on Electron Microscopy (8APEM), S. 671 - 672 (Hg. Tanaka, N.). 8th Asia-Pacific Conference on Electron Microscopy (8APEM), Kanzawa, Japan, 07. Juni 2004 - 11. Juni 2004. 8APEM Publication Committee, Ishikawa, Japan (2004)

Arns, C. H.; Knackstedt, A.; Mecke, K.: Euler-Poincare characteristics of disordered media: an application in effective medium theories. Proceedings of Microscopy Conference MC 2004, S. 714 - 715 (2004)

Avasthi, D. K.; Ghosh, S.; Srivastava, S. K.; Assmann, W.: Existence of transient temperature spike induced by SHI: evidence by ion beam analysis. Sixteenth International Conference on Ion Beam Analysis, Albuquerque, NM [USA], 29. Juni 2003 - 04. Juli 2003. Proceedings of the Sixteenth International Conference on Ion Beam Analysis, S. 206 - 214 (2004)

Böhm, J.; Gruber, P.; Spolenak, R.; Wanner, A.; Arzt, E.: A new synchrotron-based technique for measuring stresses in ultrathin metallic films. In: Nanoscale Materials and Modeling-Relations Among Processing, Microstructure and Mechanical Properties, S. P1.6.1 - P1.6.6. (Hg. Anderson, P.M.; Foecke, T.; Misra, A.; Rudd, R.E.). Nanoscale Materials and Modeling-Relations Among Processing, Microstructure and Mechanical Properties. Symposium at the MRS Spring Meeting 2004, San Francisco, 12. April 2004 - 16. April 2004. Materials Research Society, Warrendale, PA (2004)