Konferenzbeitrag (1529)

7681.
Konferenzbeitrag
Lück, R.; Gödecke, T.; Beeli, C.: Phase equilibria at internal interfaces of icosahedral Al-Mn-Pd. In: Quasicrystals - Preperation, Properties and Applications, S. K2.4.1 - K2.4.6 (Hg. Belin-Ferre, E.; Thiel, P.A.; Tsai, A.-P.; Urban, K.). Quasicrystals - Preparation, Properties and Applications, Boston, MA, USA, 27. November 2000 - 30. November 2000. MRS, Warrendale, PA, USA (2001)
7682.
Konferenzbeitrag
Lucks, I.; Lamparter, P.; Mittemeijer, E. J.: Diffraction-line profile analysis - A simple way to characterize ball-milled Mo? In: Proceedings of the Seventh European Powder Diffraction Conference, S. 451 - 456 (Hg. Delhez, R.; Mittemeijer, E.J.). 7th European Powder Diffraction Conference (EPDIC 7), Barcelona, Spain, 20. Mai 2000 - 23. Mai 2000. Trans Tech Publications Ltd., Zürich-Uetikon (2001)
7683.
Konferenzbeitrag
Lysak, N.; Gumbsch, P.; Wanner, A.: Besonderheiten der Schallemission bei der plastischen Verformung der intermetallischen Phase NiAl (Acoustic emission during plastic deformation of the intermetallic phase NiAl). In: 13. Kolloquium Schallemission, S. 89 - 100. 13. Kolloquium Schallemission, Jena, Germany, 27. September 2001 - 28. September 2001. DGZfP, Berlin, Germany (2001)
7684.
Konferenzbeitrag
Marketz, W.; Chatterjee, A.; Fischer, F. D.; Clemens, H.: Creep of γ-TiAl based alloys - experiments and computational modeling. In: 5th IUTAM Symposium on Creep in Structures, S. 17 - 30 (Hg. Murakami, S.; Ohno, N.). 5th IUTAM Symposium on Creep in Structures, Nagoya, Japan, 03. April 2000 - 07. April 2000. Kluwer Academic Publishing, Dordrecht (2001)
7685.
Konferenzbeitrag
Matics, S.; Frank, W.: Diffusion of gold in the amorphous ceramic Si28C36N36. In: Proceedings of DIMAT 2000, the Fifth International Conference on Diffusion in Materials, S. 947 - 952 (Hg. Limoge, Y.). 5th International Conference on Diffusion in Materials (DIMAT 2000), Paris, France, 17. Juli 2000 - 21. Juli 2000. Scitec Publications Ltd., Uetikon-Zürich (2001)
7686.
Konferenzbeitrag
Möbus, G.; Nufer, S.: Is atomic resolution EELS possible? In: Electron microscopy and analysis 2001. Proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, S. 151 - 154 (Hg. Aindow, M.; Kiely, C. J.). Electron microscopy and analysis 2001, Dundee, UK, 05. September 2001 - 07. September 2001. IOP Publishing Ltd., Bristol (2001)
7687.
Konferenzbeitrag
Müller, M. A.; Rempel, A. A.; Reichle, K.; Sprengel, W.; Major, J.; Schaefer, H. E.: Identification of vacancies on each sublattice of SiC by coincident Doppler broadening of the positron annihilation photons after electron irradiation. In: Positron Annihilation. Proceedings of the 12th International Conference on Positron Annihilation, S. 70 - 72 (Hg. Triftshäuser, W.). 12th International Conference on Positron Annihilation, München, Germany, 06. August 2002 - 12. August 2002. Trans Tech Publications, Zürich-Uetikon (2001)
7688.
Konferenzbeitrag
Müller, M. A.; Sprengel, W.; Major, J.; Schaefer, H. E.: Activation volume and chemical environment of atomic vacancies in intermetallic compounds. In: Positron Annihilation. Proceedings of the 12th International Conference on Positron Annihilation, S. 85 - 87 (Hg. Triftshäuser, W.). 12th International Conference on Positron Annihilation, München, 06. August 2000 - 12. August 2000. Trans Tech Publications Ltd., Zürich-Uetikon (2001)
7689.
Konferenzbeitrag
Nufer, S.; Marinopoulos, A. G.; Fabris, S.; Elsässer, C.; Kurtz, W.; Rühle, M.: Microscopic Analysis of Twin Grain Boundaries in Alumina. Microscopy and Microanalysis 2001, Long Beach [CA, USA], 05. August 2001 - 09. August 2001. Proceedings Microscopy and Microanalysis 2001, S. 312 - 313 (2001)
7690.
Konferenzbeitrag
Plachke, D.; Blohm, G.; Fischer, T.; Khellaf, A.; Kruse, O.; Stoll, H.; Carstanjen, H. D.: Ion beam analysis with monolayer depth resolution using the electrostatic spectrometer at the MPI Stuttgart. In: Proceedings of the 16th International Conference on Applications of Accelerators in Research and Industry, S. 458 - 462 (Hg. Duggan, J.L.; Morgan, I.L.). 16th International Conference on Applications of Accelerators in Research and Industry, Denton, Texas, 01. November 2000 - 05. November 2000. AIP, Melville, New York (2001)
7691.
Konferenzbeitrag
Sapalidis, P.; Dodou, D.; Hähner, P.; Zaiser, M.; Aifantis, E. C.: Fluctuation-Induced Nucleation of PLC Bands. In: Influences of interface and dislocation behavior on microstructure evolution, S. Y8.26.1 - Y8.26.6 (Hg. Aindow, M.; Asta, M.; Glazov, M.V.; Medlin, D.; Zaiser, M.). Influences of interface and dislocation behavior on microstructure evolution, Boston, Massachusetts, USA, 27. November 2000 - 30. November 2000. MRS, Warrendale, Pa. (2001)
7692.
Konferenzbeitrag
Scheu, C.; Stein, W.; Klein, S.; Tomsia, A. P.; Rühle, M.: Interfacial chemistry and structure of Cu/al2O3. Proceedings of the Third International Conference HTC-2000, Kurashiki, Japan, 19. November 2000 - 22. November 2000. Transactions of the Joining and Welding Research Institute 30 (Special issue), S. 223 - 232 (2001)
7693.
Konferenzbeitrag
Schillinger, W.; Zhang, D.; Dehm, G.; Clemens, H.: Creep behavior and microstructural stability of lamellar γ-TiAl (Cr, Mo, Si, B) with extremely fine lamellar spacing. In: High-Temperature Ordered Intermetallic Alloys IX, S. N1.4.1. - N1.4.6. (Hg. Schneidel, J. H.; Hemker, K. J.; Noebe, R. D.; Hanada, S.; Sauthoff, G.). High-Temperature Ordered Intermetallic Alloys IX, Boston, Mass., 27. November 2000 - 29. November 2000. MRS, Warrendale, PA (2001)
7694.
Konferenzbeitrag
Schmidt, C.; Dekker, J. P.; Gumbsch, P.; Arzt, E.: A new approach to understanding electromigration in Al(Cu) alloys on an atomistic basis. In: Proceedings of DIMAT 2000, the Fifth International Conference on Diffusion in Materials, S. 151 - 156 (Hg. Limoge, Y.). 5th International Conference on Diffusion in Materials (DIMAT 2000), Paris, France, 17. Juli 2000 - 21. Juli 2000. Scitec Publications Ltd., Uetikon-Zürich (2001)
7695.
Konferenzbeitrag
Schmidt, H.; Borchardt, G.; Baumann, H.; Weber, S.; Scherrer, S.; Müller, A.; Bill, J.: Tracer self-diffusion studies in amorphous Si-(B)-C-N ceramics using ion implantation and SIMS. In: Proceedings of DIMAT 2000, the Fifth International Conference on Diffusion in Materials, S. 941 - 946 (Hg. Limoge, Y.). 5th International Conference on Diffusion in Materials (DIMAT 2000), Paris, France, 17. Juli 2000 - 21. Juli 2000. Scitec Publications Ltd., Uetikon-Zürich (2001)
7696.
Konferenzbeitrag
Seeger, A.: Positronium formation in condensed matter. In: Proceedings of the 12th International Conference on Positron Annihilation, S. 257 - 259. 12th International Conference on Positron Annihilation (ICPA 12), München, 06. August 2000 - 12. August 2000. Trans Tech Publications Ltd., Zürich-Uetikon (2001)
7697.
Konferenzbeitrag
Smith, J. R.; Graat, P. C. J.; Bonnell, D. A.; French, R. H.: Relation between local composition, chemical environment and phase shift behavior in Cr-based oxycarbonitride thin films. In: Nonlithographic and Lithographic Methods of Nanofabrications, S. D5.3.1 - D5.3.6 (Hg. Merhari, L.; Rogers, J.A.; Karim, A.; Norris, D.J.; Xia, Y.). Nonlithographic and Lithographic Methods of Nanofabrications, Boston, Mass., USA, 26. November 2000 - 01. Dezember 2000. MRS, Warrendale, Pa. (2001)
7698.
Konferenzbeitrag
Sommer, E.; Terry, S. G.; Sigle, W.; Mennicke, C.; Gemming, T.; Meier, G. H.; Levi, C. G.; Rühle, M.: Metallic precipitate formation during alumina growth in a FeCrAl-based thermal barrier coating model system. In: High Temperature Corrosion and Protection of Materials 5. Proceedings of the 5th International Symposium on High Temperature Corrosion and Protection of Materials, S. 671 - 678 (Hg. Streiff, R.). High Temperature Corrosion and Protection of Materials 5, Lez Embiez, France, 22. Mai 2000 - 26. Mai 2000. Trans Tech Publications Ltd., Zürich-Uetikon (2001)
7699.
Konferenzbeitrag
Spolenak, R.; Volkert, C. A.; Ziegler, S.; Panofen, C.; Brown, W. L.: "Reverse" stress relaxation in Cu thin films. In: Dislocations and Deformation Mechanisms in Thin Films and Small Structures, S. P.1.4.1 - P.1.4.6 (Hg. Kraft, O.; Schwarz, K.; Baker, S.P.; Freud, B.; Hull, R.). Dislocations and Deformation Mechanisms in Thin Films and Small Structures, San Francisco, California, USA, 17. April 2001 - 19. April 2001. MRS, Warrendale, P: (2001)
7700.
Konferenzbeitrag
Steer, T. J.; Möbus, G.; Kraft, O.; Wagner, T.; Inkson, B. J.: 3D FIB and AFM mapping of nanoindentation zones. In: Fundamentals of Nanoidentation and Nanotribology II, S. Q3.7.1 - Q3.7.6 (Hg. Baker, S.P.). Fundamentals of Nanoidentation and Nanotribology II, Boston, Massachusetts, USA, 28. November 2000 - 30. November 2000. MRS, Boston, Mass. (2001)
Zur Redakteursansicht