Konferenzbeitrag (1416)

7521.
Konferenzbeitrag
Hofmann, S.: Nanostructure characterization by sputter depth profiling: Approaching monolayer resolution. In: Fabrication and Characterization of Atomic Scale Structures. Proceedings of the 5th International Symposium on Advanced Physical Fields, S. 563 - 569 (Hg. Yoshihara, K.). 5th International Symposium on Advanced Physical Fields, Tsukuba, Japan, 06. März 2000 - 09. März 2000. National Research Institute for Metals, Tsukuba/Japan (2000)
7522.
Konferenzbeitrag
Inkson, B.; Dehm, G.; Wagner, T.: In-situ observation of dislocation motion in Al nanowires. In: Proceedings of the 12th European Congress on Electron Microscopy. Vol. 2: Physical Sciences, S. 539 - 540 (Hg. Gemperlova, J.; Vavra, I.). 12th European Congress on Electron Microscopy (EUREM2000), Brno [Czech Republic], 09. Juli 2000 - 14. Juli 2000. Czechoslovak Society for Electron Microscopy, Brno (2000)
7523.
Konferenzbeitrag
Janisch, R.; Ochs, T.; Merkle, A.; Elsässer, C.: Structure and stability of grain boundaries in molybdenum with segregated carbon impurities. In: Multiscale Phenomena in Materials - Experiments and Modeling, S. 405 - 410 (Hg. Lassila, H.; Robertson, I. M.; Phillips, R.; Devincre, B.). MRS Fall Meeting. Symposium A: Multiscale Phenomena in Materials - Experiments and Modeling. Symposium C: Microstructural Modeling for Industrial Metals Proceessing, Boston, Mass., 30. November 1999 - 02. Dezember 1999. MRS, Warrendale, Pa. (2000)
7524.
Konferenzbeitrag
Jin-Phillipp, N. Y.; Du, K.; Phillipp, F.: Quantitative high-resolution electron microscopy studies of strain distribution and defect formation in III-V semiconductor quantum dots. In: Fabrication and Characterization of Atomic Scale Structures. Proceedings of the 5th International Symposium on Advanced Physical Fields, S. 33 - 39 (Hg. Yoshihara, K.). Fabrication and Characterization of Atomic Scale Structures. 5th International Symposium on Advanced Physical Fields (APF-5), Tsukuba, Japan, 06. März 2000 - 09. März 2000. National Research Institute for Metals, Tokyo (2000)
7525.
Konferenzbeitrag
Jin-Phillipp, N. Y.; Phillipp, F.: Direct strain measurements in InP/GaInP quantum dots by HREM. In: Proceedings of the 12th European Congress on Electron Microscopy. Vol. 2: Physical Sciences, S. 299 - 300 (Hg. Ciampor, P.; Frank, L.; Gemperlova, J.; Vavra, I.). 12th European Congress on Electron Microscopy (EUREM2000), Brno [Czech Republic], 09. Juli 2000 - 14. Juli 2000. Czechoslovak Society for Electron Microscopy, Brno (2000)
7526.
Konferenzbeitrag
Khanna, P. K.; Sommadossi, S.; Lopez, G.; Bielanska, E.; Zieba, P.; Chang, L. S.; Gust, W.; Mittemeijer, E. J.: Novel Ni/Al/Ni diffusion soldered joints for high temperature applications. In: Euromat 99. 6th European Congress on Advanced Materials and Processes. Vol. 4, S. 220 - 224 (Hg. Jouffray, B.; Svejcar, J.). EUROMAT 99, 6th European Congress on Advanced Materials and Processes, München, 27. September 1999 - 30. September 1999. Wiley-VCH, Weinheim (2000)
7527.
Konferenzbeitrag
Kim, D.; Nix, W. D.; Arzt, E.; Deal, M. D.; Plummer, J. D.: Diffusional Hillock formation in Al thin films contolled by creep. In: Thin Films: Stresses and Mechanical Properties VIII, S. 129 - 134 (Hg. Vinci, R.; Kraft, O.; Moody, N.; Besser, P.; Shaffer II, E.). Thin Films: Stresses and Mechanical Properties VIII. Symposium V at the 1999 MRS Fall Meeting, Boston, Mass., 29. November 1999 - 03. Dezember 1999. MRS, Warrendale/PA (2000)
7528.
Konferenzbeitrag
Kohnle, C.; Mintchev, S.; Schmauder, S.; Brunner, D.: Fracture of metal/ceramic interfaces. In: Proceedings of Werkstoffwoche 2000 - Materials Week 2000. Werkstoffwoche 2000 - Materials Week 2000, München, 25. September 2000 - 28. September 2000. Werkstoff-Informationsgesellschaft, Frankfurt/Main (2000)
7529.
Konferenzbeitrag
Köstlmeier, S.; Elsässer, C.: Ab-initio study of the local bonding at metal/ceramic heterophase boundaries. In: Interfacial Engineering for Optimized Properties II, S. 43 - 48 (Hg. Carter, B. C.; Hall, E. L.; Briant, C. L.; Nutt, S.). Interfacial Engineering for Optimized Properties II. Symposium at the MRS Fall Meeting, Boston, Mass., 01. Dezember 1999 - 02. Dezember 1999. (2000)
7530.
Konferenzbeitrag
Kronmüller, H.: Magnetic techniques for the study of the microstructure of crystalline metals. In: Proceedings International Symposium on Relationship between Magnetic and Structural Properties - Basis and Applications, S. 3 - 14 (Hg. Echigoya, J.; Takahashi, S.; Umakoshi, Y.; Watanabe, T.). International Symposium on Relationship between Magnetic and Structural Properties - Basis and Applications, Sendai, Japan, 2000. Iron and Steel Institute of Japan, Tokyo (2000)
7531.
Konferenzbeitrag
Kronmüller, H.: Review of coercivity mechanisms and the microstructure of nanocrystalline permanent magnets. In: Proceedings of the 11th International Symposium on Magnetic Anisotropy and Coercivity in Rare-Earth Transition Metal Alloys, S. 83 - 92 (Hg. Kaneko, H.; Homma, M.; Okada, M.). 11th International Symposium on Magnetic Anisotropy and Coercivity in Rare-Earth Transition Metal Alloys. The Japan Institute of Metal, Sendai (2000)
7532.
Konferenzbeitrag
Lejcek, P.; Hofmann, S.; Paidar, V.: Structure/property relationship for grain boundary engineering of polycrystals. In: Proceedings of the 1st International Conference on Advanced Materials Processing, S. 615 - 620 (Hg. Zhang, D. L.; Pickering, K. L.; Xiong, X. Y.). 1st International Conference on Advanced Materials Processing, Rotorua, NZ, 19. November 2000 - 23. November 2000. Institute of Materials Engineering Australasia, North Melbourne/Victoria (2000)
7533.
Konferenzbeitrag
Leoni, M.; Welzel, U.; Lamparter, P.; Mittemeijer, E. J.: Residual stress analysis in fibre-textured thin films; transverse isotropy and grain interaction. In: Proceedings of the Sixth International Conference on Residual Stresses, Oxford, UK 2000, S. 811 - 818 (Hg. Webster, G. A.). Sixth International Conference on Residual Stresses, Oxford, UK, 10. Juli 2000 - 12. Juli 2000. IOM Communications, London (2000)
7534.
Konferenzbeitrag
Niesen, T. P.; Bill, J.; Aldinger, F.: Deposition of titania thin films on different functionalized organic self-assembled monolayers. In: EUROMAT 99, Vol. 12, S. 289 - 294. EUROMAT 99, European Congress on Advanced Materials and Processes in conjunction with the Exhibition MATERIALICA, München, 27. September 1999 - 30. September 1999. Wiley-VCH, Weinheim (2000)
7535.
Konferenzbeitrag
Niesen, T.; Fuchs, T.; Bill, J.; Aldinger, F.; Sampathkumaran, U.; de Guire, M.: Deposition of nanocrystalline zirconia thin films on organic self-assembled monolayers by a continous flow technique. In: Proceedings of Werkstoffwoche 2000 - Materials Week 2000. Werkstoffwoche 2000 - Materials Week 2000, Symposium L4 on Synthesis and Technolgical Applications of Nanocrystallites and Materials Assembled from Nanometer-Sized Clusters, Session - Synthesis and Processing, Werkstoffwoche-Partnerschaft GbR, München, 25. September 2000 - 28. September 2000. Werkstoff-Informationsgesellschaft, Frankfurt/Main (2000)
7536.
Konferenzbeitrag
Nucci, J. A. R.; Keller, R.; Krämer, S.; Volkert, C. A.; Gross, M.: Localized measurement of strains in damascene copper interconnects by convergent-beam electron diffraction. In: Materials, Technology and Reliability for Advanced Interconnects and Low-k Dielectrics, S. D 851 - D 856 (Hg. Maex, K.; Joo, Y.-C.; Oehrlein, G. S.; Ogawa, S.; Wetzel, J. T.). Materials, Technology and Reliability for Advanced Interconnects and Low-k Dielectrics, San Francisco, Calif., 23. April 2000 - 27. April 2000. MRS, Warrendale (2000)
7537.
Konferenzbeitrag
Nufer, S.; Gemming, T.; Kurtz, W.; Rühle, M.: Analysis of segregation behaviour of grain boundaries in α-Al2O3 by analytical and high-resolution TEM. In: Proceedings of the 12th European Congress on Electron Microscopy, Vol. 2, S. 107 - 108 (Hg. Frank, L.; Ciampor, F.). 12th European Congress on Electron Microscopy, Brno, Czech Republic, 09. Juli 2000 - 14. Juli 2000. Czechoslovak Society for Electron Microscopy, Brno/Czech Republic (2000)
7538.
Konferenzbeitrag
Peng, J.; Seifert, H. J.; Aldinger, F.: Thermal stability of precursor-derived Si-(B-)C-N ceramics. In: Proceedings of the American Ceramic Society's 102nd Annual Meeting, S. 251 - 262 (Hg. Bansal, N. P.; Singh, J. P.). American Ceramic Society's 102nd Annual Meeting, St. Louis, USA, 30. April 2000 - 03. Mai 2000. American Ceramic Society, Westerville/OH (2000)
7539.
Konferenzbeitrag
Pundt, A.; Laudahn, U.; von Hülsen, U.; Geyer, U.; Wagner, T.; Getzlaff, M.; Bode, M.; Wiesendanger, R.; Kirchheim, R.: Hydrogen induced plastic deformation of thin films. In: Thin Films: Stresses and Mechanical Properties III, S. 75 - 86 (Hg. Vinci, R. P.; O. Kraft, N.; Moody, N.; Besser, P.; Shaffer, E.). Thin Films: Stresses and Mechanical Properties III. Symposium V at the 1999 MRS Fall Meeting, Boston, Mass., 29. November 1999 - 03. Dezember 1999. Materials Research Society, Warrendale/PA (2000)
7540.
Konferenzbeitrag
Ritley, K. A.; Schreiber, F.; Just, K.-P.; Dosch, H.; Niesen, T. P.; Aldinger, F.: Annealing studies of solution-deposited ZrO2 thin films on self-assembled monolayers. In: 4th International Conference on Thin Films Physics and Applications, S. 414 - 417 (Hg. Chu, J.; Liu, P.; Chang, Y.). 4th International Conference on Thin Films Physics and Applications, Shanghai [China], 05. Mai 2000 - 11. Mai 2000. (2000)
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