Konferenzbeitrag (1361)

7241.
Konferenzbeitrag
Zapperi, S.; Zaiser, M.: Critical behaviour of a depinning dislocation. In: Influences of Interface and Dislocation Behavior on Microstructure Evolution, S. Y7.2.1 - Y7.2.6 (Hg. Aindow, M.; Asta, M.; Glazov, M.V.; Medlin, D.L.; Rollett, A.D. et al.). Influences of Interface and Dislocation Behavior on Microstructure Evolution, Boston, Mass., 27. November 2000 - 30. November 2000. MRS, Warrendale, Pa. (2001)
7242.
Konferenzbeitrag
Zegenhagen, J.; Kazimirov, A.; Cao, L. X.; Konuma, M.; Sozontov, E.; Plachke, D.; Carstanjen, H. D.; Bilger, G.; Haller, E.; Kohn, V. et al.; Cardona, M.: Isotopic mass and lattice constant of Si and Ge: X-Ray standing wave measurements. In: Proceedings of the 25th Conference on the Physics of Semiconductors, S. 125 - 127 (Hg. Miura, N.). 25th Conference on the Physics of Semiconductors, Osaka, Japan, 17. September 2000 - 22. September 2000. Springer, Berlin [et al.] (2001)
7243.
Konferenzbeitrag
Brabers, V. A. M.; Brabers, J. H. V. J.; Walz, F.; Kronmüller, H.: Experimental and theoretical study of the Verwey transition in magnetite. In: Proceedings 8th International Conference on Ferrites, S. 123 - 125 (Hg. Abe, M.; Yamazaki, Y.). Japan Society of Powder and Powder Metallurgy, Kyoto (2000)
7244.
Konferenzbeitrag
Dehm, G.; Arzt, E.: In-situ TEM study of thermal-stress induced dislocations in a Cu thin film on a SiNx coated Si-substracte. In: Proceedings of the 12th European Congress on Electron Microscopy. Vol. 2: Physical Sciences, S. 523 - 524 (Hg. Gemperlova, J.; Vavra, I.). 12th European Congress on Electron Microscopy (EUREM2000), Brno [Czech Republic], 09. Juli 2000 - 14. Juli 2000. Czechoslovak Society for Electron Microscopy (2000)
7245.
Konferenzbeitrag
Du, K.; Jin-Phillipp, N. Y.; Phillipp, F.: Influence of experimental parameters on the accuracy of lattice-distortion measurements directly from high-resolution micrographs. In: Proceedings of the 12th European Congress on Electron Microscopy. Vol. 3, S. 137 - 138 (Hg. Ciampor, P.; Frank, L.; Tomanek, P.; Kolarik, R.). 12th European Congress on Electron Microscopy (EUREM2000), Brno [Czech Republic], 09. Juli 2000 - 14. Juli 2000. Czechoslovak Society for Electron Microscopy, Brno (2000)
7246.
Konferenzbeitrag
Eberl, K.; Schmidt, O. G.; Kienzle, O.; Ernst, F.: Preparation and optical properties of Ge and C-induced Ge dots on Si. In: Semiconductor Quantum Dots, S. 355 - 362 (Hg. Moss, S.C.). Semiconductor Quantum Dots. Symposium, San Francisco, Calif., U.S.A., 05. April 1999 - 08. April 1999. MRS, Warrendale, Pa. (2000)
7247.
Konferenzbeitrag
Flaig, A.; Wang, H.; Wanner, A.; Arzt, E.: Cyclic creep of a short-fiber reinforced aluminum alloy. In: EUROMAT 99. Vol. 5, S. 196 - 201. EUROMAT 99. 6th European Congress on Advanced Materials and Processes, München, 27. September 1999 - 30. September 1999. Wiley-VCH, Weinheim [u.a.] (2000)
7248.
Konferenzbeitrag
Frank, W.; Blüher, R.; Schmich, I.: Diffusion in icosahedral Al-Pd-Mn. In: Mass and Charge Transport in Inorganic Materials: Fundamentals to Devices. Proceedings of the International Conference on ..., S. 205 - 212 (Hg. Vincenzini, P.; Buscaglia, V.). International Conference on Mass and Charge Transport in Inorganic Materials - Fundamentals to Devices, Lido di Jesolo, Venice, Italy, 28. Mai 2000 - 02. Juni 2000. Techna, Faenza (2000)
7249.
Konferenzbeitrag
Goll, D.; Kleinschroth, I.; Kronmüller, H.: High-performance nanocrystalline PrFeB-based bonded permanent magnets. In: Proceedings of the 16th International Workshop on Rare-Earth Magnets and Their Applications, S. 641 - 650 (Hg. Kaneko, H.; Homma, M.; Okada, M.). Japan Institute of Metals, Sendai (2000)
7250.
Konferenzbeitrag
Goll, D.; Sigle, W.; Hadjipanayis, G. C.; Kronmüller, H.: Micromagnetic and microstructural analysis of the temperature dependence of the coercive field of Sm2(Co, Cu, Fe, Zr)17 permanent magnets. In: Proceedings of the 16th International Workshop on Rare-Earth Magnets and Their Applications, S. 61 - 70 (Hg. of Metals, J. I.). 16th International Workshop on Rare-Earth Magnets and Their Applications. Kaneko, H.; Homma, M.; Okada, M., Sendai (2000)
7251.
Konferenzbeitrag
Graat, P. C. J.; Somers, M. A. J.; Mittemeijer, E. J.: Initial stage oxidation kinetics of α-Fe and -Fe2N1-x. In: Mass and Charge Transport in Inorganic Materials - Fundamentals to Devices, S. 661 - 672 (Hg. Vincenzini, P.; Buscaglia, V.). International Conference on Mass and Charge Transport in Inorganic Materials - Fundamentals to Devices, Lido di Jesolo, 28. Mai 2000 - 02. Juni 2000. Techna, Faenza/Italy (2000)
7252.
Konferenzbeitrag
Gülgün, M. A.; Voitovych, R.; Bischoff, E.; Cannon, R. M.: Microstructural development in α-Al2O3. In: Grain Boundary Engineering in Ceramics, S. 115 - 125 (Hg. Sakuma, T.). Grain Boundary Engineering in Ceramics - From Grain Boundary Phenomena to Grain Boundary Quantum Structures, Nagoya [Japan], 15. März 2000 - 17. März 2000. American Ceramic Society, Westerville, OH (2000)
7253.
Konferenzbeitrag
Hesemann, H.; Müllner, P.; Kraft, O.; Arzt, E.: The effect of film thickness on stress and transformation behavior in cobalt thin films. In: Thin Films - Stresses and Mechanical Properties VIII, S. 219 - 224 (Hg. Vinci, R.). Thin Films - Stresses and Mechanical Properties VIIII. Symposium, Pittsburgh, Pa., 29. November 1999 - 03. Dezember 1999. MRS, Pittsburgh, Pa. (2000)
7254.
Konferenzbeitrag
Hirscher, M.; Fischer, S. F.; Reininger, T.: Fundamental investigations and industrial applications of magnetostriction. In: Modern Trends in Magnetostriction Study and Application. Proceedings of the NATO Advanced Study Institute on Modern Trends in Magnetostriction, S. 307 - 329 (Hg. Gibbs, M.R.J.). NATO Advanced Study Institute on Modern Trends in Magnetostriction, Kyiv, Ukraine, 22. Mai 2000 - 02. Juni 2000. Kluwer Academic Publishers, Dordrecht/Netherlands (2000)
7255.
Konferenzbeitrag
Hofmann, S.: Nanostructure characterization by sputter depth profiling: Approaching monolayer resolution. In: Fabrication and Characterization of Atomic Scale Structures. Proceedings of the 5th International Symposium on Advanced Physical Fields, S. 563 - 569 (Hg. Yoshihara, K.). 5th International Symposium on Advanced Physical Fields, Tsukuba, Japan, 06. März 2000 - 09. März 2000. National Research Institute for Metals, Tsukuba/Japan (2000)
7256.
Konferenzbeitrag
Inkson, B.; Dehm, G.; Wagner, T.: In-situ observation of dislocation motion in Al nanowires. In: Proceedings of the 12th European Congress on Electron Microscopy. Vol. 2: Physical Sciences, S. 539 - 540 (Hg. Gemperlova, J.; Vavra, I.). 12th European Congress on Electron Microscopy (EUREM2000), Brno [Czech Republic], 09. Juli 2000 - 14. Juli 2000. Czechoslovak Society for Electron Microscopy, Brno (2000)
7257.
Konferenzbeitrag
Janisch, R.; Ochs, T.; Merkle, A.; Elsässer, C.: Structure and stability of grain boundaries in molybdenum with segregated carbon impurities. In: Multiscale Phenomena in Materials - Experiments and Modeling, S. 405 - 410 (Hg. Lassila, H.; Robertson, I. M.; Phillips, R.; Devincre, B.). MRS Fall Meeting. Symposium A: Multiscale Phenomena in Materials - Experiments and Modeling. Symposium C: Microstructural Modeling for Industrial Metals Proceessing, Boston, Mass., 30. November 1999 - 02. Dezember 1999. MRS, Warrendale, Pa. (2000)
7258.
Konferenzbeitrag
Jin-Phillipp, N. Y.; Du, K.; Phillipp, F.: Quantitative high-resolution electron microscopy studies of strain distribution and defect formation in III-V semiconductor quantum dots. In: Fabrication and Characterization of Atomic Scale Structures. Proceedings of the 5th International Symposium on Advanced Physical Fields, S. 33 - 39 (Hg. Yoshihara, K.). Fabrication and Characterization of Atomic Scale Structures. 5th International Symposium on Advanced Physical Fields (APF-5), Tsukuba, Japan, 06. März 2000 - 09. März 2000. National Research Institute for Metals, Tokyo (2000)
7259.
Konferenzbeitrag
Jin-Phillipp, N. Y.; Phillipp, F.: Direct strain measurements in InP/GaInP quantum dots by HREM. In: Proceedings of the 12th European Congress on Electron Microscopy. Vol. 2: Physical Sciences, S. 299 - 300 (Hg. Ciampor, P.; Frank, L.; Gemperlova, J.; Vavra, I.). 12th European Congress on Electron Microscopy (EUREM2000), Brno [Czech Republic], 09. Juli 2000 - 14. Juli 2000. Czechoslovak Society for Electron Microscopy, Brno (2000)
7260.
Konferenzbeitrag
Khanna, P. K.; Sommadossi, S.; Lopez, G.; Bielanska, E.; Zieba, P.; Chang, L. S.; Gust, W.; Mittemeijer, E. J.: Novel Ni/Al/Ni diffusion soldered joints for high temperature applications. In: Euromat 99. 6th European Congress on Advanced Materials and Processes. Vol. 4, S. 220 - 224 (Hg. Jouffray, B.; Svejcar, J.). EUROMAT 99, 6th European Congress on Advanced Materials and Processes, München, 27. September 1999 - 30. September 1999. Wiley-VCH, Weinheim (2000)
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